{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T17:23:13Z","timestamp":1785604993471,"version":"3.56.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003977","name":"Israel Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003977","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/jssc.2023.3309865","type":"journal-article","created":{"date-parts":[[2023,9,14]],"date-time":"2023-09-14T17:53:15Z","timestamp":1694713995000},"page":"1847-1857","source":"Crossref","is-referenced-by-count":8,"title":["Voltage Level Detection for Near-<i>V<\/i>\n                  <sub>TH<\/sub> Computing"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3709-8609","authenticated-orcid":false,"given":"Asaf","family":"Feldman","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Omer","family":"Nechushtan","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9184-8642","authenticated-orcid":false,"given":"Joseph","family":"Shor","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803941"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2079450"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2012.6176932"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2014.6986099"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007164"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc55480.2022.9911389"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2011.2168017"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3196287"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2505961"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2600565"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2880776"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2015.7313874"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2049447"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3164454"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3005792"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541914"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3009452"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401701"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2206683"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2092110"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.806258"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1977.1050882"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3137338"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2754644"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2092997"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10540332\/10251163.pdf?arnumber=10251163","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T04:37:36Z","timestamp":1716957456000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10251163\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":25,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2023.3309865","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}