{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T17:04:58Z","timestamp":1781283898496,"version":"3.54.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/jssc.2023.3330835","type":"journal-article","created":{"date-parts":[[2023,11,17]],"date-time":"2023-11-17T19:09:09Z","timestamp":1700248149000},"page":"1735-1746","source":"Crossref","is-referenced-by-count":2,"title":["Enabling Online GaN Power Device Self-Health Monitoring With Analog SGD Supervised Learning and <i>T<\/i>\n                  <sub>\n                     <i>J<\/i>\n                  <\/sub>-Independent Precursor Measurement"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5897-9480","authenticated-orcid":false,"given":"Yuanqing","family":"Huang","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8687-9858","authenticated-orcid":false,"given":"Yingping","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4457-7157","authenticated-orcid":false,"given":"D. Brian","family":"Ma","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/28\/7\/074011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/9781118844779"},{"key":"ref3","first-page":"87","article-title":"Driving GaN power transistors-circuit design challenges and opportunities","volume-title":"Proc. IEEE Int. Symp. Power Semiconductor Devices (ICs)","author":"Ma"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2346485"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2271977"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838461"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2006.346799"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936282"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.923743"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096624"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2820700"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3029450"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2018.8341180"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2924600"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2950311"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/WiPDA.2016.7799957"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1017\/9781108164085"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2395591"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063061"},{"key":"ref20","volume-title":"Thermal Design for Packaged GaNpx Devices","year":"2020"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2868807"},{"key":"ref22","volume-title":"Power loss calculation with common source inductance consideration for synchronous buck converters","author":"Jauregui","year":"2011"},{"key":"ref23","volume-title":"Thermal Performance of EPC EGaN? FETs","year":"2019"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1137\/16M1080173"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2710281"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2284363"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2599536"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2356197"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1049\/PBCS002E"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2170597"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.853609"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/el:19750011"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1049\/el:19940853"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/82.842116"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062999"},{"key":"ref36","article-title":"Degradation of GaN high electron mobility transistors under high-power and high-temperature stress","volume":"111","author":"Ancona","year":"2012","journal-title":"J. Appl. Phys"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10540332\/10320386.pdf?arnumber=10320386","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T04:38:16Z","timestamp":1716957496000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10320386\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":36,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2023.3330835","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}