{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:20:55Z","timestamp":1777656055933,"version":"3.51.4"},"reference-count":54,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62021004"],"award-info":[{"award-number":["62021004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92164301"],"award-info":[{"award-number":["92164301"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62022065"],"award-info":[{"award-number":["62022065"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U19A2053"],"award-info":[{"award-number":["U19A2053"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/jssc.2024.3390247","type":"journal-article","created":{"date-parts":[[2024,4,26]],"date-time":"2024-04-26T18:00:23Z","timestamp":1714154423000},"page":"3767-3779","source":"Crossref","is-referenced-by-count":1,"title":["A 0.08%\/V 32.3-ppm\/\u00b0C 36.6-kHz Unregulated Current-Reuse Ring Oscillator With <i>V<\/i>GS-Ratio-Based Compensation Using One-Type-Only Resistor"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-3584-1453","authenticated-orcid":false,"given":"Zhicheng","family":"Dong","sequence":"first","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9942-0069","authenticated-orcid":false,"given":"Shubin","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9447-8763","authenticated-orcid":false,"given":"Xiaoteng","family":"Zhao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Baotian","family":"Hao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1403-7094","authenticated-orcid":false,"given":"Xianting","family":"Su","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6609-9486","authenticated-orcid":false,"given":"Hongzhi","family":"Liang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7196-2710","authenticated-orcid":false,"given":"Menghao","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7764-1928","authenticated-orcid":false,"given":"Zhangming","family":"Zhu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi&#x2019;an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2586178"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2018.2884657"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2886336"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3182118"},{"key":"ref5","volume-title":"CC2541 Data Sheet","year":"2013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062968"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3092424"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3139649"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2020.3020787"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062945"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280052"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3090682"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2008.4523201"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS45839.2020.9069038"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3067051"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731730"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3183208"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2009.2021914"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401344"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.863149"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063029"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2191043"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162838"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3277617"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3121014"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3048664"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CICC51472.2021.9431492"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10182024"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/cicc57935.2023.10121302"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2517133"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.876206"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2541718"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3234009"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2009.2021922"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/81.933328"},{"key":"ref36","first-page":"60","article-title":"A 0.01 mm2 10 MHz RC frequency reference with a 1-point on-chip-trimmed inaccuracy of \u00b10.28% from -45\u2218C to 125\u00b0C in 0.18\u03bcm CMOS","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"An"},{"key":"ref37","volume-title":"Design of Analog CMOS Integrated Circuits","author":"Razavi","year":"2015"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2012.6243859"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2908284"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3088157"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2554883"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.808156"},{"key":"ref43","volume-title":"Analysis and Design of Analog Integrated Circuits","author":"Gray","year":"2009"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2579159"},{"key":"ref45","first-page":"C44","article-title":"A 2.2\u03bcW 600 kHz frequency-locked relaxation oscillator with 0.046%\/V voltage and 48.69ppm\/\u00b0C temperature stability for IoT sensor node applications","volume-title":"Proc. Symp. VLSI Circuits","author":"Meng"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2014.6757443"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417927"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2824307"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2019.8780148"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870310"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2519383"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2772808"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067729"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW.2016.7904904"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10736122\/10508792.pdf?arnumber=10508792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T00:09:37Z","timestamp":1732666177000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10508792\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":54,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3390247","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}