{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:27:05Z","timestamp":1772040425262,"version":"3.50.1"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","award":["IO201209-07917-01"],"award-info":[{"award-number":["IO201209-07917-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Institute of Information and Communications Technology Planning and Evaluation"},{"name":"Korean Government","award":["2022-0-01171"],"award-info":[{"award-number":["2022-0-01171"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,10]]},"DOI":"10.1109\/jssc.2024.3391902","type":"journal-article","created":{"date-parts":[[2024,4,30]],"date-time":"2024-04-30T19:26:58Z","timestamp":1714505218000},"page":"3232-3241","source":"Crossref","is-referenced-by-count":10,"title":["A 25-kHz-BW 97.4-dB-SNDR SAR-Assisted Continuous-Time 1\u20130 MASH Delta-Sigma Modulator With Digital Noise Coupling"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7127-8312","authenticated-orcid":false,"given":"Dong-Hun","family":"Lee","sequence":"first","affiliation":[{"name":"Samsung Electronics, Giheung, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5858-0453","authenticated-orcid":false,"given":"Kent Edrian","family":"Lozada","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7497-1932","authenticated-orcid":false,"given":"Ye-Dam","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]},{"given":"Ho-Jin","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6021-6813","authenticated-orcid":false,"given":"Youngjae","family":"Cho","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}]},{"given":"Michael","family":"Choi","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6947-7785","authenticated-orcid":false,"given":"Seung-Tak","family":"Ryu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2717937"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2593777"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3032152"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2959480"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc55480.2022.9911295"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871111"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2778284"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc53895.2021.9634711"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3182406"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2016.7418015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2616361"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8624017"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401444"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2894034"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2466459"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2942359"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/a-sscc58667.2023.10347940"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2594953"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.112045"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364833"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3171790"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2925273"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10693678\/10510428.pdf?arnumber=10510428","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,26]],"date-time":"2024-09-26T17:46:06Z","timestamp":1727372766000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10510428\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10]]},"references-count":22,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3391902","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,10]]}}}