{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T19:02:01Z","timestamp":1771614121344,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Education","doi-asserted-by":"publisher","award":["2022R1A2C3012245"],"award-info":[{"award-number":["2022R1A2C3012245"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2024,10]]},"DOI":"10.1109\/jssc.2024.3404597","type":"journal-article","created":{"date-parts":[[2024,6,5]],"date-time":"2024-06-05T17:53:11Z","timestamp":1717609991000},"page":"3444-3456","source":"Crossref","is-referenced-by-count":2,"title":["A Fully Integrated Nine-Ratio Switched-Capacitor Converter With Overlapped-Conversion-Ratio Modulation for IoT Applications"],"prefix":"10.1109","volume":"59","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3411-3997","authenticated-orcid":false,"given":"Hyunjin","family":"Kim","sequence":"first","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4059-597X","authenticated-orcid":false,"given":"Taehyeong","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2067-0557","authenticated-orcid":false,"given":"Inho","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Inha University, Incheon, South Korea."}]},{"given":"Changhun","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea."}]},{"given":"Seokjin","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea."}]},{"given":"Seokhee","family":"Han","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea."}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7999-3305","authenticated-orcid":false,"given":"Junwon","family":"Jeong","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Sookmyung Women’s University, Seoul, South Korea."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4379-7905","authenticated-orcid":false,"given":"Chulwoo","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea."}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2221233"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2705170"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FTFC.2014.6828615"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2009.2032440"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2353791"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2015.2501985"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3235305"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417985"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2889870"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2159054"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487776"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2528478"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933623"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2410800"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2015.7387488"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2866929"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2884351"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067583"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3048481"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3046514"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.1995.474969"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2235084"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487775"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2833278"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3012504"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2525822"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/cicc.2019.8780341"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2360400"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2517133"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2534778"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2751512"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2019.8662491"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063076"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2870558"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2019.2950152"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2023.3297605"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067756"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/10693678\/10549516.pdf?arnumber=10549516","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,26]],"date-time":"2024-09-26T06:06:48Z","timestamp":1727330808000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10549516\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10]]},"references-count":37,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3404597","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,10]]}}}