{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:08:52Z","timestamp":1774966132729,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"Basic Science Research Program through the National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006404","name":"Ministry of Science and Information and Communication Technology","doi-asserted-by":"publisher","award":["NRF-2023R1A2C3005110"],"award-info":[{"award-number":["NRF-2023R1A2C3005110"]}],"id":[{"id":"10.13039\/501100006404","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/jssc.2024.3407137","type":"journal-article","created":{"date-parts":[[2024,6,6]],"date-time":"2024-06-06T13:27:40Z","timestamp":1717680460000},"page":"432-442","source":"Crossref","is-referenced-by-count":7,"title":["An Intrinsically Linear Multi-Rate Continuous-Time Zoom ADC Achieving 97.4-dB DR and 105.7-dB SFDR in 50-kHz Signal Bandwidth"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-2775-9103","authenticated-orcid":false,"given":"Junghyun","family":"Yoon","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7613-6690","authenticated-orcid":false,"given":"MoonHyung","family":"Jang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Stanford University, Stanford, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6390-4977","authenticated-orcid":false,"given":"Changuk","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Sciences, University of California at Berkeley, Berkeley, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1161-5671","authenticated-orcid":false,"given":"Yong","family":"Lim","sequence":"additional","affiliation":[{"name":"System LSI Business, Samsung Electronics Inc., Hwaseong, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1618-169X","authenticated-orcid":false,"given":"Youngcheol","family":"Chae","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/vlsic.2019.8777944"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063112"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2540811"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365807"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2332885"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2021.3119641"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3032152"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2717937"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2992891"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9366002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/vlsic.2019.8778026"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2959480"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc55480.2022.9911295"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3188626"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821291"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2018.8502318"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2936946"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3224878"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217871"},{"issue":"4","key":"ref20","doi-asserted-by":"crossref","first-page":"860","DOI":"10.1109\/JSSC.2016.2519395","article-title":"A 10\/20\/30\/40 MHz feedforward FIR DAC continuous-time \u0394\u03a3 ADC with robust blocker performance for radio receivers","volume":"51","author":"Loeda","year":"2016","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/cicc57935.2023.10121244"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2865466"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3044896"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3203567"},{"key":"ref25","first-page":"410","article-title":"A 2.87 \u03bcW 1 kHz-BW 94.0dB-SNDR 2-0 MASH ADC using FIA with dynamic-body-biasing assisted CLS technique","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","volume":"65","author":"Hu"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2669022"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3011967"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871111"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2959479"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063159"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830166"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/10857664\/10550909.pdf?arnumber=10550909","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T18:10:15Z","timestamp":1762539015000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10550909\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":31,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3407137","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}