{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T05:45:12Z","timestamp":1775627112815,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003836","name":"IC Design Education Center","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003836","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004358","name":"Samsung Electronics","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/jssc.2024.3409630","type":"journal-article","created":{"date-parts":[[2024,6,13]],"date-time":"2024-06-13T13:53:06Z","timestamp":1718286786000},"page":"272-285","source":"Crossref","is-referenced-by-count":13,"title":["A 0.5\u20131-V Time-Voltage Hybrid Domain Dual- Loop Analog LDO With Wide-Bandwidth High PSR in 28 nm"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1435-9140","authenticated-orcid":false,"given":"Jun-Hwan","family":"Jang","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Hanyang University, Seoul, South Korea"}]},{"given":"Hui-Dong","family":"Gwon","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi, South Korea"}]},{"given":"Sungmin","family":"Yoo","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi, South Korea"}]},{"given":"Jun-Hyeok","family":"Yang","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9283-8243","authenticated-orcid":false,"given":"Byong-Deok","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Hanyang University, Seoul, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2290702"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2019.2940489"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/asscc.2017.8240268"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2018.2881072"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731792"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870283"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063147"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2960004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2010.5617586"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2342380"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870401"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2614308"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2682862"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2740269"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2766215"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2870558"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3007760"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3077453"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3144437"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2967540"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2596708"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2767183"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662343"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2840492"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162880"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2987718"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3015527"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2039685"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2328800"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/4.678659"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2090088"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2053859"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2022.3180774"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/10856383\/10555033.pdf?arnumber=10555033","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T18:24:35Z","timestamp":1764613475000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10555033\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":33,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3409630","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}