{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,12]],"date-time":"2026-07-12T04:16:39Z","timestamp":1783829799151,"version":"3.55.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","award":["IO201218-08228-01"],"award-info":[{"award-number":["IO201218-08228-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]},{"name":"IITP grant funded by the Korea Government","award":["IO201218-08228-01"],"award-info":[{"award-number":["IO201218-08228-01"]}]},{"name":"IITP grant funded by the Korea Government","award":["RS-2023-00222171"],"award-info":[{"award-number":["RS-2023-00222171"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/jssc.2024.3431288","type":"journal-article","created":{"date-parts":[[2024,7,29]],"date-time":"2024-07-29T14:01:13Z","timestamp":1722261673000},"page":"519-528","source":"Crossref","is-referenced-by-count":4,"title":["An 80-Gb\/s\/pin Single-Ended Voltage-Mode PAM-4 Transmitter With a Pulsewidth Pre-Emphasis and a 4-Tap FFE in 28-nm CMOS"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-9240-4118","authenticated-orcid":false,"given":"Jae-Koo","family":"Park","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, High-Speed Circuits and Systems Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3294-3540","authenticated-orcid":false,"given":"Dae-Won","family":"Rho","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, High-Speed Circuits and Systems Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2386-0234","authenticated-orcid":false,"given":"Seung-Jae","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, High-Speed Circuits and Systems Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0067-4657","authenticated-orcid":false,"given":"Woo-Young","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, High-Speed Circuits and Systems Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3222203"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3104093"},{"key":"ref3","volume-title":"Common Electrical I\/O (CEI)-112G, Optical Interconnect Forum (OIF)","year":"2020"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870474"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672165"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2317142"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC58667.2023.10347963"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC53450.2021.9567818"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365784"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3108969"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2411625"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3109562"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3038818"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778102"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870425"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3330485"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3042240"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2779439"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8777952"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2353795"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2874040"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2939081"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067552"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CICC53496.2022.9772814"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/10857664\/10612820.pdf?arnumber=10612820","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T18:48:17Z","timestamp":1764701297000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10612820\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":24,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3431288","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}