{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T06:15:24Z","timestamp":1784268924974,"version":"3.55.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/jssc.2024.3433003","type":"journal-article","created":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T18:04:50Z","timestamp":1722535490000},"page":"568-578","source":"Crossref","is-referenced-by-count":15,"title":["A 60-Frames\/s CMOS Image Sensor With Pixelwise Conversion Gain Modulation and Self-Triggered ADCs for Per-Frame Adaptive DCG-HDR Imaging"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2635-6040","authenticated-orcid":false,"given":"Yi","family":"Luo","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of British Columbia (UBC), Vancouver, BC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8852-1633","authenticated-orcid":false,"given":"Shahriar","family":"Mirabbasi","sequence":"additional","affiliation":[{"name":"Department of Component Development (DCD), vivo Mobile Communication Co., Ltd., Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"218","article-title":"1.5 \u03bcm dual conversion gain, backside illuminated image sensor using stacked pixel level connections with 13ke-full-well capacitance and 0.8e-noise","author":"Venezia","year":"2018","journal-title":"IEDM Tech. Dig."},{"key":"ref2","first-page":"1","article-title":"A high optical performance 2.8 \u03bcm BSI LOFIC pixel with 120ke\u2013FWC and 160 \u03bcV\/e\u2013conversion gain","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Miyauchi"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3165517"},{"key":"ref4","first-page":"1","article-title":"World\u2019s first 16:4:1 triple conversion gain sensor with all-pixel AF for 82.4 dB single exposure HDR","volume-title":"Proc. Symp. Electron. Imag.","author":"Park"},{"key":"ref5","first-page":"1","article-title":"A 1280 \u00d7 1080 4.2 \u03bcm split-diode pixel hdr sensor in 110 nm BSI CMOS process","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Willassen"},{"key":"ref6","first-page":"106","article-title":"5.7 a 132 dB single-exposure-dynamic-range CMOS image sensor with high temperature tolerance","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Sakano"},{"key":"ref7","first-page":"1","article-title":"A comparison of high dynamic range CIS technologies for automotive applications","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Solhusvik"},{"key":"ref8","first-page":"1","article-title":"A 1392 \u00d7 976 2.8 \u03bcm 120 dB CIS with per-pixel controlled conversion gain","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Solhusvik"},{"issue":"305","key":"ref9","first-page":"1","article-title":"A 750 K photo-charge linear full well in a 3.2 \u03bcm HDR pixel with complementary carrier collection","volume":"18","author":"Lalanne","year":"2018","journal-title":"MDPI Sensors"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/rs14030771"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365740"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/OJCAS.2022.3213062"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2932623"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3275271"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2763822"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3149916"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/vlsitechnologyandcir57934.2023.10185405"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10181676"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PG.2007.17"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1201\/9781315156255"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870265"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2827918"},{"key":"ref23","first-page":"1","article-title":"An 0.08e-pJ\/step 14-bit gain-adaptive single-slope column ADC with enhanced HDR function for high-quality imagers","volume-title":"Proc. IEEE Symp. VLSI Technol. Circuits","author":"Hung"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830315"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731656"},{"key":"ref26","first-page":"1","article-title":"4.0 \u03bcm stacked voltage mode global shutter pixels with a BSI LOFIC and a PDAF capability","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Miyauchi"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s23094478"},{"key":"ref28","first-page":"102","article-title":"2.1e-temporal noise and -105dB parasitic light sensitivity backside-illuminated 2.3 \u03bcm-pixel voltage-domain global shutter CMOS image sensor using high-capacity DRAM capacitor technology","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Lee"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM45625.2022.10019558"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/s20020486"},{"key":"ref31","first-page":"102","article-title":"A 1\/1.57-inch 50Mpixel CMOS image sensor with 1.0 \u03bcm all-directional dual pixel by 0.5 \u03bcm-pitch full-depth deep-trench isolation technology","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","volume":"65","author":"Jung"},{"key":"ref32","first-page":"96","article-title":"A 0.64 \u03bcm 4-Photodiode 1.28 \u03bcm 50Mpixel CMOS image sensor with 0.98e- temporal noise and 20Ke- full-well capacity employing quarter-ring source-follower","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Kim"},{"key":"ref33","first-page":"1","article-title":"Evolution of a 4.6 \u03bcm, 512 \u00d7 512, ultra-low power stacked digital pixel sensor for performance and power efficiency improvement","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Ikeno"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/10857664\/10620065.pdf?arnumber=10620065","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,30]],"date-time":"2025-01-30T05:45:36Z","timestamp":1738215936000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10620065\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":33,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3433003","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}