{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,25]],"date-time":"2026-04-25T14:38:29Z","timestamp":1777127909937,"version":"3.51.4"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000266","name":"Engineering and Physical Sciences Research Council","doi-asserted-by":"publisher","award":["EP\/T001259\/1"],"award-info":[{"award-number":["EP\/T001259\/1"]}],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/jssc.2024.3434638","type":"journal-article","created":{"date-parts":[[2024,8,20]],"date-time":"2024-08-20T11:41:23Z","timestamp":1724154083000},"page":"603-614","source":"Crossref","is-referenced-by-count":10,"title":["A 1.76 mW, 355-fps, Electrical Impedance Tomography System With a Simple Time-to-Digital Impedance Readout for Fast Neonatal Lung Imaging"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-3826-5845","authenticated-orcid":false,"given":"Jiayang","family":"Li","sequence":"first","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University College London, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9575-8831","authenticated-orcid":false,"given":"Dai","family":"Jiang","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University College London, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2818-7327","authenticated-orcid":false,"given":"Yu","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University College London, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-2878-9743","authenticated-orcid":false,"given":"Jiaxing","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University College London, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6431-2404","authenticated-orcid":false,"given":"Nima","family":"Seifnaraghi","sequence":"additional","affiliation":[{"name":"Department of Natural Sciences, Middlesex University, The Burroughs, Hendon, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8863-6385","authenticated-orcid":false,"given":"Richard","family":"Bayford","sequence":"additional","affiliation":[{"name":"Department of Natural Sciences, Middlesex University, The Burroughs, Hendon, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0623-963X","authenticated-orcid":false,"given":"Andreas","family":"Demosthenous","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, University College London, London, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1164\/rccm.201808-1551LE"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870407"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2019.2925713"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662352"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3006430"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2355835"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3032723"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1203\/PDR.0b013e318193f117"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10877-016-9920-y"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1164\/rccm.202007-2997OC"},{"issue":"8","key":"ref11","article-title":"Kangaroo mother care to reduce morbidity and mortality in low birthweight infants","author":"Conde-Agudelo","year":"2016","journal-title":"Cochrane Database Syst. Rev."},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662433"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2858148"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2023.3265678"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/1741-2552\/aad78e"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2020.3012057"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/22\/1\/311"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3294753"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052869"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2359962"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/4.918915"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731728"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/10.310088"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/BF02345070"},{"key":"ref25","volume-title":"EIDORS","year":"2024"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2021.3094773"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2464705"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/10857664\/10642974.pdf?arnumber=10642974","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T18:48:15Z","timestamp":1764701295000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10642974\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":27,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3434638","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}