{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:17:20Z","timestamp":1784996240679,"version":"3.55.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T00:00:00Z","timestamp":1748736000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T00:00:00Z","timestamp":1748736000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T00:00:00Z","timestamp":1748736000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003621","name":"Ministry of Science and ICT and Future Planning (MSIT), South Korea","doi-asserted-by":"publisher","award":["NRF-2021R1A2C2012045"],"award-info":[{"award-number":["NRF-2021R1A2C2012045"]}],"id":[{"id":"10.13039\/501100003621","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003052","name":"K-Fabless Program through the Ministry of Trade, Industry and Energy (MOTIE), South Korea","doi-asserted-by":"publisher","award":["20015989"],"award-info":[{"award-number":["20015989"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,6]]},"DOI":"10.1109\/jssc.2024.3474831","type":"journal-article","created":{"date-parts":[[2024,10,16]],"date-time":"2024-10-16T13:58:28Z","timestamp":1729087108000},"page":"2146-2157","source":"Crossref","is-referenced-by-count":11,"title":["A 100 \u00d7 80 Flash LiDAR Sensor With In-Pixel Zoom-Histogramming TDC and Self-Referenced Single-Slope ADC Based on Analog Counters"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4879-0657","authenticated-orcid":false,"given":"Su-Hyun","family":"Han","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seonghyeok","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bumjun","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2668-6739","authenticated-orcid":false,"given":"Jung-Hoon","family":"Chun","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4700-1900","authenticated-orcid":false,"given":"Jaehyuk","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9353-5148","authenticated-orcid":false,"given":"Seong-Jin","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/12.850611"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2021.3118332"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2623635"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062997"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2939083"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2883720"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2023.3238520"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9366022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3202247"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3048074"},{"key":"ref11","article-title":"9.8\u03bcm SPAD-based analogue single photon counting pixel with bias controlled sensitivity","volume-title":"Proc. Int. Image Sensor Workshop (IISW)","author":"Dutton"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2009.5325970"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2312094"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2015.2482497"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2022.3179579"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3094524"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830305"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063045"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2464682"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2018.2867439"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2276752"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2939664"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2102590"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MCD.2005.1438751"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185251"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19574.2021.9720605"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731622"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11018061\/10720670.pdf?arnumber=10720670","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T18:24:37Z","timestamp":1764613477000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10720670\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6]]},"references-count":27,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3474831","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,6]]}}}