{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T07:00:56Z","timestamp":1771657256110,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Korean Government [Ministry of Science and ICT (MSIT)]","award":["2023R1A2C2007598"],"award-info":[{"award-number":["2023R1A2C2007598"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/jssc.2024.3510883","type":"journal-article","created":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T17:35:43Z","timestamp":1733938543000},"page":"2558-2567","source":"Crossref","is-referenced-by-count":4,"title":["A 2.72-fJ\/Conversion-Step 13-bit SAR ADC With Wide Common-Mode Complementary Split Pre-Amplifier Comparator and Grounded-Finger CDAC"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6397-7324","authenticated-orcid":false,"given":"Sewon","family":"Lee","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-1138-5530","authenticated-orcid":false,"given":"Hyein","family":"Kang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1500-1404","authenticated-orcid":false,"given":"Minjae","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365863"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2023.3311418"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC60959.2024.10528997"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2417803"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2278471"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523145"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063125"},{"key":"ref8","first-page":"2014","article-title":"Comparator common-mode variation effects analysis and its application in SAR ADCs","volume-title":"Proc. IEEE Int. Symp. Circuits Syst. (ISCAS)","author":"Sanyal"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2190117"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2042254"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2279571"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2862890"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2883084"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2878830"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757481"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3135559"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3057372"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454566"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2820147"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731728"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2960485"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3268719"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3020194"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882489"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1117\/12.658982"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.875818"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401506"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2822823"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC58667.2023.10347995"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3235521"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2950188"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11071629\/10792657.pdf?arnumber=10792657","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T18:48:23Z","timestamp":1764701303000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10792657\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":31,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3510883","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}