{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T18:59:05Z","timestamp":1764701945131,"version":"3.46.0"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62374109"],"award-info":[{"award-number":["62374109"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1109\/jssc.2024.3516881","type":"journal-article","created":{"date-parts":[[2024,12,23]],"date-time":"2024-12-23T14:19:32Z","timestamp":1734963572000},"page":"2920-2932","source":"Crossref","is-referenced-by-count":1,"title":["A 2.2-ps Time-of-Flight Resolution Frequency-Domain fNIRS Readout IC With a Dynamic Architecture and Cross-Coupling-Free Intensity and Phase-to-Digital Converter"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-0498-9024","authenticated-orcid":false,"given":"Zhouchen","family":"Ma","sequence":"first","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6216-5562","authenticated-orcid":false,"given":"Yuxiang","family":"Lin","sequence":"additional","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9239-9490","authenticated-orcid":false,"given":"Cheng","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4412-4948","authenticated-orcid":false,"given":"Xiang'ao","family":"Qi","sequence":"additional","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6322-8614","authenticated-orcid":false,"given":"Yongfu","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9689-1236","authenticated-orcid":false,"given":"Kea-Tiong","family":"Tang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Tsing Hua University (NTHU), Hsinchu, Taiwan"}]},{"given":"Fa","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai United Imaging Microelectronics Technology, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5379-7119","authenticated-orcid":false,"given":"Tianhong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Shanghai Mental Health Center, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0235-1475","authenticated-orcid":false,"given":"Guoxing","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2140-1236","authenticated-orcid":false,"given":"Jian","family":"Zhao","sequence":"additional","affiliation":[{"name":"Department of Micro\/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/1.NPh.6.3.035007"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.bandl.2011.05.003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2504412"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2013.07.009"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.clinph.2011.10.006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2020.00724"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2013.06.075"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.pdpdt.2023.103633"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/1.JBO.22.1.014001"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3389\/fnhum.2013.00444"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2021.3076762"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.pscychresns.2024.111810"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2798924"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.medengphy.2008.10.004"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2014.107"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2810213"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310300"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365757"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2883289"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1117\/12.2581482"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2013.05.106"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/sj.neo.7900082"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1158\/0008-5472.CAN-12-0056"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2020.00300"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2016.2586103"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/app10186522"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2024.3372887"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3006442"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2260651"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1117\/12.2608961"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/1.1149123"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454486"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-007-4664-0"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.7326\/0003-4819-82-1-132_2"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2645613"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2018.2867140"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2873630"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1117\/12.183988"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3268719"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.34133\/cbsystems.0047"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3389\/fphys.2023.1208010"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.jocn.2021.10.009"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11095840\/10811875.pdf?arnumber=10811875","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T18:48:27Z","timestamp":1764701307000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10811875\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8]]},"references-count":42,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2024.3516881","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"type":"print","value":"0018-9200"},{"type":"electronic","value":"1558-173X"}],"subject":[],"published":{"date-parts":[[2025,8]]}}}