{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T17:10:49Z","timestamp":1772644249347,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Research and Development Program through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT","award":["RS-2023-00281047"],"award-info":[{"award-number":["RS-2023-00281047"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/jssc.2025.3557795","type":"journal-article","created":{"date-parts":[[2025,4,16]],"date-time":"2025-04-16T13:51:18Z","timestamp":1744811478000},"page":"305-317","source":"Crossref","is-referenced-by-count":3,"title":["A 15-Gb\/s PAM-3 Transceiver With Hybrid Equalization and Time-Domain Decoder for High-Bandwidth-Memory Interfaces"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-6794-3519","authenticated-orcid":false,"given":"Hwaseok","family":"Shin","sequence":"first","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0594-4206","authenticated-orcid":false,"given":"Yoonjae","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8247-6277","authenticated-orcid":false,"given":"Jincheol","family":"Sim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-7100-4051","authenticated-orcid":false,"given":"Youngwook","family":"Kwon","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-6701-5370","authenticated-orcid":false,"given":"Seungwoo","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3695-2703","authenticated-orcid":false,"given":"Seongcheol","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-6748-1283","authenticated-orcid":false,"given":"Changmin","family":"Sim","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-0860-1895","authenticated-orcid":false,"given":"Junseob","family":"So","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea"}]},{"given":"Seon-Been","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2072-2989","authenticated-orcid":false,"given":"Taehwan","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4379-7905","authenticated-orcid":false,"given":"Chulwoo","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Seoul, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2910617"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939084"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2360379"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2018.8310257"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMW59701.2024.10536972"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3006864"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662462"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454326"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3104093"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3042240"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731740"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2359665"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3231654"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3098821"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2879020"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2973640"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2024.3406928"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.826317"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373420"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2028449"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/EDAPS.2015.7383697"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/3DIC.2015.7334555"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9063162"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830454"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2774276"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731653"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11318064\/10966012.pdf?arnumber=10966012","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T06:36:19Z","timestamp":1767076579000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10966012\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":27,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3557795","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}