{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T17:48:36Z","timestamp":1772300916944,"version":"3.50.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFB4403100"],"award-info":[{"award-number":["2023YFB4403100"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62422407"],"award-info":[{"award-number":["62422407"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62125403"],"award-info":[{"award-number":["62125403"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92464302"],"award-info":[{"award-number":["92464302"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U24B20164"],"award-info":[{"award-number":["U24B20164"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92164301"],"award-info":[{"award-number":["92164301"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Municipal Science and Technology Major Project"},{"name":"Natural Science Foundation of Jiangsu Province Basic Research Program","award":["BK20243042"],"award-info":[{"award-number":["BK20243042"]}]},{"DOI":"10.13039\/501100017582","name":"Beijing National Research Center for Information Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100017582","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Beijing Advanced Innovation Center for Integrated Circuits","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/jssc.2025.3566283","type":"journal-article","created":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T13:15:22Z","timestamp":1747746922000},"page":"763-776","source":"Crossref","is-referenced-by-count":2,"title":["ETCIM: Error-Tolerant Digital CIM Processor With Redundancy-Free Hard Error Repair and Run-Time Soft Error Correction"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9657-3617","authenticated-orcid":false,"given":"Yiqi","family":"Wang","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"given":"Zhen","family":"He","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"given":"Chenggang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Institute for Interdisciplinary Information Sciences, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5858-8850","authenticated-orcid":false,"given":"Zihan","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8433-7281","authenticated-orcid":false,"given":"Mingyu","family":"Gao","sequence":"additional","affiliation":[{"name":"Institute for Interdisciplinary Information Sciences, Tsinghua University, Beijing, China"}]},{"given":"Huiming","family":"Han","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5117-7920","authenticated-orcid":false,"given":"Shaojun","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6942-4395","authenticated-orcid":false,"given":"Yang","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2228-8829","authenticated-orcid":false,"given":"Fengbin","family":"Tu","sequence":"additional","affiliation":[{"name":"Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2309-572X","authenticated-orcid":false,"given":"Shouyi","family":"Yin","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Beijing Innovation Center for Future Chip, and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Advanced Memory Device Correction (AMDC) for Servers","year":"2020"},{"key":"ref2","volume-title":"Early TSMC 5nm Test Chip Yields 80%, HVM Coming in H1 2020","year":"2020"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067339"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067544"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731679"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365766"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC53895.2021.9634742"},{"key":"ref8","article-title":"Error detection in sram","author":"Ehlig","year":"2017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2018.00015"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757419"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731754"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454556"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/mi13081332"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref15","article-title":"The AMD Athlon XP processor with 512KB L2 cache","author":"Huynh","year":"2003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/5.705525"},{"key":"ref17","first-page":"1","article-title":"Understanding error propagation in deep learning neural network (DNN) accelerators and applications","volume-title":"Proc. Int. Conf. High Perform. Comput., Netw., Storage Anal.","author":"Li"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067555"},{"key":"ref19","volume-title":"NVIDIA GPU Memory Error Management","year":"2024"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2006.1705289"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2609386"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365984"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2018.00067"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731762"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067285"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731645"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067842"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2408332"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3222059"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454372"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46783.2024.10631443"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3406569"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/45\/4\/040204"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454489"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11368630\/11007640.pdf?arnumber=11007640","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,2]],"date-time":"2026-02-02T20:44:18Z","timestamp":1770065058000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11007640\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":34,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3566283","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}