{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T13:44:50Z","timestamp":1769867090641,"version":"3.49.0"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/jssc.2025.3567294","type":"journal-article","created":{"date-parts":[[2025,5,26]],"date-time":"2025-05-26T14:00:21Z","timestamp":1748268021000},"page":"704-712","source":"Crossref","is-referenced-by-count":0,"title":["EMEP: Early-Monitoring Error Prediction for Activity and Variability Resilience in a 28-nm RISC-V Controller"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8873-8314","authenticated-orcid":false,"given":"Clara Nieto","family":"Taladriz","sequence":"first","affiliation":[{"name":"ESAT-MICAS, KU Leuven, Leuven, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6792-7965","authenticated-orcid":false,"given":"Wim","family":"Dehaene","sequence":"additional","affiliation":[{"name":"ESAT-MICAS, KU Leuven, Leuven, Belgium"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719516"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3023001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3347469"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2910792"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3282678"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2749423"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2821121"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2951692"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3046099"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2418713"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC58667.2023.10348009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2841824"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865360"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.070"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2013.6690999"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3106245"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3027953"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2893294"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2013.6649125"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3220525"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3303424"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11368630\/11015592.pdf?arnumber=11015592","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T21:03:18Z","timestamp":1769806998000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11015592\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":21,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3567294","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}