{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T01:49:24Z","timestamp":1770774564484,"version":"3.50.0"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2019YFB2204701"],"award-info":[{"award-number":["2019YFB2204701"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62022023"],"award-info":[{"award-number":["62022023"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Major Key Project of the Peng Cheng Laboratory"},{"DOI":"10.13039\/501100001809","name":"Big Data Computing Center, Southeast University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/jssc.2025.3568389","type":"journal-article","created":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T13:15:22Z","timestamp":1747746922000},"page":"4210-4226","source":"Crossref","is-referenced-by-count":0,"title":["A 62\u201392-GHz 12.4% Efficiency Harmonics-Recycling CMOS Frequency Quadrupler Using Amplitude-Phase Coordinating Technique"],"prefix":"10.1109","volume":"60","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-7527-9428","authenticated-orcid":false,"given":"Zhen","family":"Lin","sequence":"first","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6544-2868","authenticated-orcid":false,"given":"Yizhu","family":"Shen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3060-4271","authenticated-orcid":false,"given":"Yifan","family":"Ding","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yifan","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1167-2307","authenticated-orcid":false,"given":"Sanming","family":"Hu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-021-00664-z"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2011.2143650"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2672721"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3425889"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3336018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3353220"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3352555"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3360120"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3185160"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3404263"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3020291"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3393021"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3371162"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3317073"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3381595"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3339198"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2980509"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3000569"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3157643"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3284600"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3292182"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3289512"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IMS30576.2020.9223769"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2022.3203047"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3245653"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.2967390"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2017.8112934"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.23919\/EuMIC.2018.8539958"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IMaRC45935.2019.9118726"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2843332"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2021.3097711"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6177008"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2021.3068179"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2025.3529081"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454525"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3364096"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/LMWT.2023.3336896"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC54547.2023.10186198"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC49505.2020.9218386"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2015.7337755"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2021.3055628"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2020.3028053"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2528981"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3031877"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2024.3367882"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11230034\/11007278.pdf?arnumber=11007278","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T21:05:04Z","timestamp":1770757504000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11007278\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":45,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3568389","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}