{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T23:09:54Z","timestamp":1780355394744,"version":"3.54.1"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research and Development Program through the National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Korean Government","award":["RS-2024-00339543"],"award-info":[{"award-number":["RS-2024-00339543"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1109\/jssc.2025.3569882","type":"journal-article","created":{"date-parts":[[2025,6,10]],"date-time":"2025-06-10T13:52:09Z","timestamp":1749563529000},"page":"3602-3612","source":"Crossref","is-referenced-by-count":1,"title":["A 14-to-32-Gb\/s Deadzone-Free Referenceless CDR With Autocovariance-Based Seamless Frequency Detector in 40-nm CMOS Technology"],"prefix":"10.1109","volume":"60","author":[{"given":"Hong-Seok","family":"Choi","sequence":"first","affiliation":[{"name":"SK Hynix, Icheon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-9775-231X","authenticated-orcid":false,"given":"Jae-Geon","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hanyang University, Ansan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Seung-Hwan","family":"Gong","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hanyang University, Ansan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kwang-Ho","family":"Lee","sequence":"additional","affiliation":[{"name":"Convergence Signal SoC Research Center, Korea Electronics Technology Institute (KETI), Seongnam, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daehyun","family":"Koh","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jung-Woo","family":"Sull","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyungrok","family":"Do","sequence":"additional","affiliation":[{"name":"SK Hynix, Icheon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chan-Ho","family":"Kye","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Engineering, University of Gachon, Seongnam, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0436-703X","authenticated-orcid":false,"given":"Deog-Kyoon","family":"Jeong","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4727-9868","authenticated-orcid":false,"given":"Kwanseo","family":"Park","sequence":"additional","affiliation":[{"name":"Department of System Semiconductor Engineering, the Department of Electrical and Electronic Engineering, and the BK21 Graduate Program in Intelligent Semiconductor Technology, Yonsei University, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8638-6332","authenticated-orcid":false,"given":"Min-Seong","family":"Choo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hanyang University, Ansan, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3116485"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2512713"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2744661"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2927408"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2497963"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005750"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3030816"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3027021"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2859947"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2429714"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2503721"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.806284"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856577"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2009.4977369"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2031042"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2168872"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2296152"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2594077"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2082272"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11183661\/11029275.pdf?arnumber=11029275","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T18:48:31Z","timestamp":1764701311000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11029275\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10]]},"references-count":19,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3569882","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10]]}}}