{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T11:59:35Z","timestamp":1769860775931,"version":"3.49.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2018YFE0205900"],"award-info":[{"award-number":["2018YFE0205900"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Major Key Project of Peng Cheng Laboratory","award":["PCL2021A01-2"],"award-info":[{"award-number":["PCL2021A01-2"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/jssc.2025.3579724","type":"journal-article","created":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T13:34:29Z","timestamp":1750772069000},"page":"549-565","source":"Crossref","is-referenced-by-count":0,"title":["An 11-GHz Ultra-Fast Wideband FMCW Chirp Generator With 0.051% RMS Frequency Error Under 2.3-GHz Chirp Bandwidth and 2.3-GHz\/\n                    <i>\u03bc<\/i>\n                    s Slope in 65-nm CMOS"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-6516-111X","authenticated-orcid":false,"given":"Xuan","family":"Wang","sequence":"first","affiliation":[{"name":"National Mobile Communications Research Laboratory, School of Information Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6984-8611","authenticated-orcid":false,"given":"Xujun","family":"Ma","sequence":"additional","affiliation":[{"name":"T&#x00E9;l&#x00E9;com SudParis, Institut Polytechnique de Paris, Palaiseau, France"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6237-0504","authenticated-orcid":false,"given":"Yupeng","family":"Fu","sequence":"additional","affiliation":[{"name":"National Mobile Communications Research Laboratory, School of Information Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6677-424X","authenticated-orcid":false,"given":"Xu","family":"Wu","sequence":"additional","affiliation":[{"name":"National Mobile Communications Research Laboratory, School of Information Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2762-6567","authenticated-orcid":false,"given":"Dongming","family":"Wang","sequence":"additional","affiliation":[{"name":"National Mobile Communications Research Laboratory, School of Information Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1873-4806","authenticated-orcid":false,"given":"Lianming","family":"Li","sequence":"additional","affiliation":[{"name":"National Mobile Communications Research Laboratory, School of Information Science and Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0809-8511","authenticated-orcid":false,"given":"Xiaohu","family":"You","sequence":"additional","affiliation":[{"name":"National Mobile Communications Research Laboratory, School of Information Science and Engineering, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RADAR.2017.7944250"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2017.2711978"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3206107"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2011.2172812"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2018.8357114"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICMIM.2018.8443352"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454289"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2869097"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2016.7417995"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2301764"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3004363"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3123693"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3129900"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185335"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3021311"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3331519"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2941113"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/rfic.2019.8701731"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2856248"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2011.5746324"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3041153"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3272676"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032723"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2596766"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2403373"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3019344"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2899726"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454283"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/0471732699"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3297618"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217854"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3111134"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2162917"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/vlsitechnologyandcir46783.2024.10631416"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2580599"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731575"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11368630\/11048873.pdf?arnumber=11048873","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T21:03:24Z","timestamp":1769807004000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11048873\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":36,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3579724","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}