{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T13:04:09Z","timestamp":1769864649050,"version":"3.49.0"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Singapore NRF and DSO through the SHINE Medium Sized Centre"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/jssc.2025.3608858","type":"journal-article","created":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T17:31:19Z","timestamp":1758130279000},"page":"690-703","source":"Crossref","is-referenced-by-count":0,"title":["SRAM Static Entropy Extraction From Every Single Transistor in Unmodified Bitcell and Data Fingerprinting for Provenance Assurance"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-4198-5105","authenticated-orcid":false,"given":"Tianqi","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1271-3361","authenticated-orcid":false,"given":"Joydeep","family":"Basu","sequence":"additional","affiliation":[{"name":"Department of Electronics and Telecommunication Engineering, Jadavpur University, Kolkata, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5353-7109","authenticated-orcid":false,"given":"Viveka","family":"Konandur Rajanna","sequence":"additional","affiliation":[{"name":"Department of Electronic Systems Engineering, Indian Institute of Science (Bengaluru), Karnataka, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4127-8258","authenticated-orcid":false,"given":"Massimo","family":"Alioto","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341361"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-41395-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2239134"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7063023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2923503"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2022.3223274"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74735-2_5"},{"key":"ref10","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","volume-title":"Proc. 44th Annu. Conf. Design Autom. (DAC)","author":"Suh"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910961"},{"key":"ref12","article-title":"Intrinsic PUFs from flip-flops on reconfigurable devices","volume-title":"Proc. WISSec","volume":"17","author":"Maes","year":"2025"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224311"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3192903"},{"key":"ref15","volume-title":"HW Security Primitives Green IC Database","author":"Alioto","year":"2025"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2011.6055318"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2791460"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3035207"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3125255"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185261"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC60305.2024.10848665"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2938133"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC55480.2022.9911331"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3233373"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365829"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3157811"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3014386"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/csac.2002.1176287"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2636859"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417955"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365741"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2019.8662439"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2865584"},{"key":"ref36","volume-title":"Probability & Statistics for Engineers & Scientists","author":"Walpole","year":"2006"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2886350"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353655"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3189351"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11368630\/11168123.pdf?arnumber=11168123","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T21:03:29Z","timestamp":1769807009000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11168123\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":39,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3608858","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}