{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,12]],"date-time":"2026-09-12T17:18:21Z","timestamp":1789233501744,"version":"build-2803163510"},"reference-count":59,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62574058"],"award-info":[{"award-number":["62574058"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Key Research and Development Program of China","award":["2023YFB4403802"],"award-info":[{"award-number":["2023YFB4403802"]}]},{"DOI":"10.13039\/501100001809","name":"Fundamental Research Funds for Central Universities in China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/jssc.2025.3618610","type":"journal-article","created":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T17:58:13Z","timestamp":1761587893000},"page":"2631-2645","source":"Crossref","is-referenced-by-count":2,"title":["Frequency-Agile Self-Interference Cancellation in a Wideband Compact Full-Duplex Receiver Using Cascaded Low-Noise and High-Delay-Bandwidth-Product APFs"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-6824-6635","authenticated-orcid":false,"given":"Xingyu","family":"Ma","sequence":"first","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9177-4551","authenticated-orcid":false,"given":"Wei","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shijiao","family":"Dong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5071-0674","authenticated-orcid":false,"given":"Ruiyu","family":"Lyu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1085-9333","authenticated-orcid":false,"given":"Fan","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0066-8890","authenticated-orcid":false,"given":"Yunyou","family":"Pu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5240-9551","authenticated-orcid":false,"given":"Chuangguo","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1852-4112","authenticated-orcid":false,"given":"Hongtao","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2015.2505281"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2022.3229110"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2021.3113120"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/WPMC50192.2020.9309473"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2014.6815892"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2015.2493060"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICONSTEM.2019.8918884"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CAMAD55695.2022.9966913"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1859995.1859997"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2013.101713.121152"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2015.2403614"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2014.2330193"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2017.1600583"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2613039"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2021.3073153"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310353"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2905146"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2978020"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3022813"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3055230"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC49505.2020.9218390"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2477043"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC54547.2023.10186132"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870387"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310238"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3312675"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719413"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3063658"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365947"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3247744"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2873809"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3200369"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3328247"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904506"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/SPAWC.2018.8445987"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICCT46805.2019.8947009"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/IEEECONF56349.2022.10052049"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2896561"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3185124"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2482495"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2900612"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.2989386"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3355067"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2390214"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2693229"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.3011723"},{"key":"ref47","first-page":"454","article-title":"Wideband time-delay circuit","volume-title":"Proc. 6th Eur. Microw. Integr. Circuit Conf.","author":"Chang"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2013.6674570"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937466"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2482578"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184478"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2945303"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/4.127337"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/IWS55252.2022.9977624"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2017.7870436"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2052513"},{"key":"ref57","first-page":"4219","article-title":"Exploring high-dimensional search space via Voronoi graph traversing","volume-title":"Proc. 40th Conf. Uncertainty Artif. Intell. (UAI)","author":"Zhao"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT62049.2024.10831447"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3351615"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11538140\/11217539.pdf?arnumber=11217539","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T19:35:08Z","timestamp":1780342508000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11217539\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":59,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3618610","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}