{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,28]],"date-time":"2026-10-28T16:55:29Z","timestamp":1793206529397,"version":"4.5.0"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Jiashan Fudan Institute, Jiashan, Zhejiang, China"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/jssc.2025.3628611","type":"journal-article","created":{"date-parts":[[2025,11,12]],"date-time":"2025-11-12T18:41:49Z","timestamp":1762972909000},"page":"873-883","source":"Crossref","is-referenced-by-count":3,"title":["A 14-Cell Battery Monitoring AFE With 1-mV Total Measurement Error and Integrated Electrochemical Impedance Spectroscopy"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-8420-8437","authenticated-orcid":false,"given":"Xining","family":"Zhang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2967-0140","authenticated-orcid":false,"given":"Yuxiang","family":"Tang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-2045-1313","authenticated-orcid":false,"given":"Yaohua","family":"Pan","sequence":"additional","affiliation":[{"name":"Novosense Microelectronics, Suzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenhui","family":"Qin","sequence":"additional","affiliation":[{"name":"Novosense Microelectronics, Suzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jian","family":"Ye","sequence":"additional","affiliation":[{"name":"Novosense Microelectronics, Suzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shaoyu","family":"Ma","sequence":"additional","affiliation":[{"name":"Novosense Microelectronics, Suzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yun","family":"Sheng","sequence":"additional","affiliation":[{"name":"Novosense Microelectronics, Suzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9968-5964","authenticated-orcid":false,"given":"Zhiliang","family":"Hong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4150-0971","authenticated-orcid":false,"given":"Jiawei","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2016.2538200"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.02.064"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISPCE.2012.6398297"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2786199"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3062267"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2011.03.136"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196439"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2311389"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2300861"},{"key":"ref10","volume-title":"16-Channel Multicell Battery Monitor"},{"key":"ref11","volume-title":"Functional Safety-Compliant Automotive 16S\/14S\/12S Battery Monitor, Balancer and Integrated Hardware Protector"},{"key":"ref12","volume-title":"Li-Ion Battery Monitoring and Balancing IC"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3373513"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3097668"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3160021"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3436676"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2025.3628611"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067607"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3516040"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2143610"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032710"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/5.542410"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2060253"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3127462"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.826202"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3033458"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CICC57935.2023.10121252"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3307471"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2253217"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2913101"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2810213"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/31.34666"},{"key":"ref33","volume-title":"Ultralow Noise XFET Voltage References With Current Sink and Source Capability"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3098225"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3151106"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11411866\/11242016.pdf?arnumber=11242016","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T20:44:45Z","timestamp":1772138685000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11242016\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":35,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2025.3628611","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}