{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,28]],"date-time":"2026-03-28T06:38:03Z","timestamp":1774679883818,"version":"3.50.1"},"reference-count":61,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100012389","name":"National Institute of Information and Communications Technology","doi-asserted-by":"crossref","award":["JPJ012368C00801"],"award-info":[{"award-number":["JPJ012368C00801"]}],"id":[{"id":"10.13039\/501100012389","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Ministry of Internal Affairs and Communications (MIC)"},{"name":"Science Tokyo STAR Search"},{"name":"VLSI Design and Education Center (VDEC) in collaboration with Cadence Design Systems, Inc., Mentor Graphics Inc., and Keysight Technologies Japan Ltd."}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/jssc.2026.3657367","type":"journal-article","created":{"date-parts":[[2026,2,3]],"date-time":"2026-02-03T20:55:01Z","timestamp":1770152101000},"page":"1294-1307","source":"Crossref","is-referenced-by-count":0,"title":["A 52 Gb\/s 8.9-dBm EIRP 300-GHz-Band Amplifier-Last Outphasing Transmitter With Path Mismatch Calibration in 65-nm CMOS"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-5916-6333","authenticated-orcid":false,"given":"Chun","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-0076-0834","authenticated-orcid":false,"given":"Olivia","family":"Angel Yong","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8667-3892","authenticated-orcid":false,"given":"Hans","family":"Herdian","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8436-3073","authenticated-orcid":false,"given":"Wenqian","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9258-3367","authenticated-orcid":false,"given":"Abanob","family":"Shehata","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9974-7299","authenticated-orcid":false,"given":"Carrel","family":"da Gomez","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5645-3688","authenticated-orcid":false,"given":"Chenxin","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9061-541X","authenticated-orcid":false,"given":"Yudai","family":"Yamazaki","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1163-4976","authenticated-orcid":false,"given":"Kazuaki","family":"Kunihiro","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6304-6358","authenticated-orcid":false,"given":"Hiroyuki","family":"Sakai","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6467-3667","authenticated-orcid":false,"given":"Yuncheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8172-4323","authenticated-orcid":false,"given":"Atsushi","family":"Shirane","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1082-7672","authenticated-orcid":false,"given":"Kenichi","family":"Okada","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MVT.2018.2848498"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MVT.2019.2921208"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2016.65"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2017.8066476"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2016.7540141"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2018.8439850"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005818"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2025.3579360"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2021.3099064"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2023.3320930"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-014-0140-6"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3292182"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2025.3566726"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC61187.2024.10599981"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2467179"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC61187.2024.10599983"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2024.3387285"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2602223"},{"key":"ref19","first-page":"308","article-title":"A 105 Gb\/s 300 GHz CMOS transmitter","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"Takano"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3179166"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3006433"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454273"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49661.2025.10904783"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC61187.2024.10599928"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2504930"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2599533"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICMMTS62835.2025.10925961"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2839037"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3207995"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2916851"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2677908"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2023.3239792"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2015.2477604"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2560198"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2018.2823202"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2021.3095235"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3185160"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/rfic61188.2025.11082866"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2964150"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3204807"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2928694"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731626"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2021.3108486"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3057077"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC61187.2024.10599962"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904706"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3148385"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3038882"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2626340"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3339198"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2025.3574413"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3091546"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2019.2908335"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3092168"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2899515"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3299735"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.23919\/vlsitechnologyandcir65189.2025.11074869"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/OJAP.2024.3422426"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3353067"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310237"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3515640"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11457062\/11370729.pdf?arnumber=11370729","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,28]],"date-time":"2026-03-28T05:09:21Z","timestamp":1774674561000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11370729\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":61,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2026.3657367","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}