{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T20:00:51Z","timestamp":1785182451696,"version":"3.55.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2023YFB4402400"],"award-info":[{"award-number":["2023YFB4402400"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["92464201"],"award-info":[{"award-number":["92464201"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/jssc.2026.3668132","type":"journal-article","created":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T20:52:38Z","timestamp":1772571158000},"page":"4450-4462","source":"Crossref","is-referenced-by-count":0,"title":["A 28-nm Hybrid-Domain Outer Product-Based Floating-Point SRAM Computing-in-Memory Macro With Logarithm Bit-Width Residual ADC for Edge AI"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8261-1707","authenticated-orcid":false,"given":"Yiyang","family":"Yuan","sequence":"first","affiliation":[{"name":"Institute of Microelectronics","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhongyi","family":"Sun","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiming","family":"Yang","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1825-7595","authenticated-orcid":false,"given":"Xinghua","family":"Wang","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2609-3554","authenticated-orcid":false,"given":"Xiaoran","family":"Li","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cailian","family":"Ma","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5625-1594","authenticated-orcid":false,"given":"Qirui","family":"Chen","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Meini","family":"Tang","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xi","family":"Wei","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-7447-7004","authenticated-orcid":false,"given":"Hao","family":"Wu","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haitao","family":"Wang","sequence":"additional","affiliation":[{"name":"BIT Chongqing Institute of Microelectronics and Microsystems","place":["Chongqing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0425-7911","authenticated-orcid":false,"given":"Qihao","family":"Liu","sequence":"additional","affiliation":[{"name":"Shandong SinoChip Semiconductor Company Ltd.","place":["Jinan, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chengying","family":"Chen","sequence":"additional","affiliation":[{"name":"Xiamen University of Technology","place":["Xiamen, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8234-7400","authenticated-orcid":false,"given":"Jinshan","family":"Yue","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3579-8740","authenticated-orcid":false,"given":"Pui-In","family":"Mak","sequence":"additional","affiliation":[{"name":"University of Macau (UM)","place":["Macau, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2316-0392","authenticated-orcid":false,"given":"Feng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics","place":["Beijing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.34133\/icomputing.0006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2024.3373763"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3626202.3637562"},{"key":"ref4","first-page":"114","article-title":"Keyformer: KV cache reduction through key tokens selection for efficient generative inference","volume-title":"Proc. Mach. Learn. Syst.","author":"Adnan"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01386"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC47750.2019.9027656"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2019.01.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365791"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067260"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067779"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454313"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3309966"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731762"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454447"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662392"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067526"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365984"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067335"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365766"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731545"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731754"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067555"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454278"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC47793.2019.9056933"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3108344"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067527"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3064189"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062985"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904606"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904738"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11623245\/11418916.pdf?arnumber=11418916","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T19:04:34Z","timestamp":1785179074000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11418916\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":30,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2026.3668132","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}