{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T20:00:15Z","timestamp":1785182415134,"version":"3.55.0"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/jssc.2026.3669626","type":"journal-article","created":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T19:53:40Z","timestamp":1773172420000},"page":"4442-4449","source":"Crossref","is-referenced-by-count":0,"title":["A 13.8% Speed-Enhanced 1 T Mask ROM by Algorithmically Signed Program Data on 3-nm Fin-FET Logic CMOS"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-0976-9795","authenticated-orcid":false,"given":"Ryota","family":"Watanabe","sequence":"first","affiliation":[{"name":"TSMC Design Technology Japan","place":["Yokohama, Kanagawa, Japan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9986-5308","authenticated-orcid":false,"given":"Koji","family":"Nii","sequence":"additional","affiliation":[{"name":"TSMC Design Technology Japan","place":["Yokohama, Kanagawa, Japan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0616-1452","authenticated-orcid":false,"given":"Hidemitsu","family":"Kojima","sequence":"additional","affiliation":[{"name":"TSMC Design Technology Japan","place":["Yokohama, Kanagawa, Japan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kazumasa","family":"Uno","sequence":"additional","affiliation":[{"name":"TSMC Design Technology Japan","place":["Yokohama, Kanagawa, Japan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hiromasa","family":"Otsubo","sequence":"additional","affiliation":[{"name":"TSMC Design Technology Japan","place":["Yokohama, Kanagawa, Japan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-2669-7157","authenticated-orcid":false,"given":"Ted","family":"Chu","sequence":"additional","affiliation":[{"name":"Taiwan Semiconductor Manufacturing Company Ltd.","place":["Hsinchu, Taiwan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hong-Chen","family":"Cheng","sequence":"additional","affiliation":[{"name":"Taiwan Semiconductor Manufacturing Company Ltd.","place":["Hsinchu, Taiwan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yih","family":"Wang","sequence":"additional","affiliation":[{"name":"Taiwan Semiconductor Manufacturing Company Ltd.","place":["Hsinchu, Taiwan"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6505-5474","authenticated-orcid":false,"given":"Tsung-Yung Jonathan","family":"Chang","sequence":"additional","affiliation":[{"name":"Taiwan Semiconductor Manufacturing Company Ltd.","place":["Hsinchu, Taiwan"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2021.3099726"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-51103-4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2006.1593365"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1983.tb03113.x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/25.61359"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.879264"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2890150"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3289185"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3242897"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2017.8280163"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.862343"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2004.1362403"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672110"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2011.6055317"},{"key":"ref15","first-page":"C208","article-title":"A 28nm ROM with two-step decoding scheme and OD-space-effect minimization to achieve 30% speed and 190 mV vmin improvement","volume-title":"Proc. Symp. VLSI Circuits","author":"Wu"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2246201"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2015.7406972"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2015.7169203"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2016.7482552"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11623245\/11427357.pdf?arnumber=11427357","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T19:02:52Z","timestamp":1785178972000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11427357\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":19,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2026.3669626","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}