{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,28]],"date-time":"2026-08-28T05:21:35Z","timestamp":1787894495525,"version":"build-2784847793"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62474046"],"award-info":[{"award-number":["62474046"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2026,9]]},"DOI":"10.1109\/jssc.2026.3686843","type":"journal-article","created":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T19:54:05Z","timestamp":1777665245000},"page":"4804-4816","source":"Crossref","is-referenced-by-count":0,"title":["A 760 mV\n                    <sub>PP<\/sub>\n                    -Input-Range, 103.6 dB-SNDR Direct-Digitization Sensor Readout With Pseudo-Differential Integrator and Impedance-Equalized RDAC"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0441-3561","authenticated-orcid":false,"given":"Kaiwen","family":"Zhou","sequence":"first","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianhong","family":"Zhou","sequence":"additional","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-3636-9624","authenticated-orcid":false,"given":"Yijie","family":"Li","sequence":"additional","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6586-7002","authenticated-orcid":false,"given":"Yuying","family":"Li","sequence":"additional","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-4349-8969","authenticated-orcid":false,"given":"Tian","family":"Dong","sequence":"additional","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9968-5964","authenticated-orcid":false,"given":"Zhiliang","family":"Hong","sequence":"additional","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4150-0971","authenticated-orcid":false,"given":"Jiawei","family":"Xu","sequence":"additional","affiliation":[{"name":"Fudan University","place":["Shanghai, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/11\/112001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2578303"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2554147"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3055458"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3211886"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-023-38274-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s41378-025-00959-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3202795"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731114"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-49939-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454270"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3018478"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365985"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2019.2936327"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3037833"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3503281"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3520384"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2025.3563304"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2025.3558094"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-022-26971-9"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2191675"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s19122760"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2016.10.005"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3090100"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3284524"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3199492"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/s41378-024-00825-y"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1126\/science.ade0086"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC59616.2023.10268812"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2018.8310269"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2021.3062632"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2018.8502264"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2753824"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CICC57935.2023.10121272"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2931811"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341366"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2197929"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2011.6123556"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CICC60959.2024.10529076"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2717937"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2939077"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc59616.2023.10268724"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4\/11668579\/11503282.pdf?arnumber=11503282","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,8,28]],"date-time":"2026-08-28T05:15:07Z","timestamp":1787894107000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11503282\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9]]},"references-count":42,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2026.3686843","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9]]}}}