{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T08:07:13Z","timestamp":1777450033484,"version":"3.51.4"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2016,2,1]],"date-time":"2016-02-01T00:00:00Z","timestamp":1454284800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,2,1]],"date-time":"2016-02-01T00:00:00Z","timestamp":1454284800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,2,1]],"date-time":"2016-02-01T00:00:00Z","timestamp":1454284800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61305049"],"award-info":[{"award-number":["61305049"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["91338202"],"award-info":[{"award-number":["91338202"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61375024"],"award-info":[{"award-number":["61375024"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["91438105"],"award-info":[{"award-number":["91438105"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Sel. Top. Appl. Earth Observations Remote Sensing"],"published-print":{"date-parts":[[2016,2]]},"DOI":"10.1109\/jstars.2015.2471176","type":"journal-article","created":{"date-parts":[[2015,9,11]],"date-time":"2015-09-11T18:43:18Z","timestamp":1441996998000},"page":"595-608","source":"Crossref","is-referenced-by-count":21,"title":["Semisupervised Hyperspectral Image Classification via Discriminant Analysis and Robust Regression"],"prefix":"10.1109","volume":"9","author":[{"given":"Guangliang","family":"Cheng","sequence":"first","affiliation":[{"name":"National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Feiyun","family":"Zhu","sequence":"additional","affiliation":[{"name":"National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shiming","family":"Xiang","sequence":"additional","affiliation":[{"name":"National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ying","family":"Wang","sequence":"additional","affiliation":[{"name":"National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunhong","family":"Pan","sequence":"additional","affiliation":[{"name":"National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2006.877950"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2008.916070"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2007.910220"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2305805"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.831865"},{"key":"ref52","article-title":"A tutorial on principal component analysis","volume":"abs 1404 1100","author":"shlens","year":"2014","journal-title":"CoRR"},{"key":"ref11","article-title":"A survey on semi-supervised learning techniques","volume":"abs 1402 4645","author":"jothi prakash","year":"2014","journal-title":"CoRR"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2162649"},{"key":"ref10","article-title":"Semi-supervised learning literature survey","author":"zhu","year":"2005"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2010.2060550"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2011.2139193"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2010.2072929"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2012.2228275"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2231951"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2014.2305441"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2013.2264508"},{"key":"ref46","first-page":"739","article-title":"Robust L1 norm factorization in the presence of outliers and missing data by alternative convex programming","author":"ke","year":"0","journal-title":"Proc IEEE Conf Comput Vis Pattern Recog"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611972771.73"},{"key":"ref48","article-title":"A new robust function that smoothly interpolates between ${l_1}$ and ${l_2}$ error functions","author":"ding","year":"2013"},{"key":"ref47","first-page":"1813","article-title":"Efficient and robust feature selection via joint ${l_{2,1}}$ norms minimization","author":"nie","year":"0","journal-title":"Adv Neural Inf Process Syst (NIPS)"},{"key":"ref42","author":"horaud","year":"0","journal-title":"A short tutorial on graph Laplacians Laplacian embedding and spectral clustering"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1145\/1963405.1963487"},{"key":"ref44","first-page":"577","article-title":"Constrained k-means clustering with background knowledge","author":"wagstaff","year":"0","journal-title":"Proc Int Conf Mach Learn (ICML)"},{"key":"ref43","first-page":"505","article-title":"Distance metric learning with application to clustering with side-information","author":"xing","year":"2002","journal-title":"Proc Adv Neural Inf Process Syst (NIPS)"},{"key":"ref49","author":"dalla mura","year":"0","journal-title":"Hyperspectral Image Analysis"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/nrc2294"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2010.2045764"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.4304\/jcp.9.8.1946-1951"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2007.892009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2012.2205002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2007.898446"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/36.406684"},{"key":"ref40","first-page":"585","article-title":"Laplacian eigenmaps and spectral techniques for embedding and clustering","author":"belkin","year":"2001","journal-title":"Adv Neural Inf Process Syst (NIPS) 19"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.842478"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/36.905239"},{"key":"ref37","first-page":"1565","article-title":"Adaptive loss minimization for semi-supervised elastic embedding","author":"nie","year":"0","journal-title":"Proc Int Joint Conf Artif Intell"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1080\/01431161.2010.512425"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2049528"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/34.1000236"},{"key":"ref33","author":"soille","year":"2003","journal-title":"Morphological Image Analysis Principles and Applications"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1023\/B:VISI.0000022288.19776.77"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.841417"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0471723800"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2010.35"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2667615"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2211551"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1155\/2012\/814356"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2013.2244604"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2151866"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2007.895416"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2012.2192741"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2197589"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2010.2048116"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2013.2286953"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.922034"}],"container-title":["IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4609443\/7404297\/07258310.pdf?arnumber=7258310","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,4,27]],"date-time":"2023-04-27T22:31:51Z","timestamp":1682634711000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7258310\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,2]]},"references-count":55,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jstars.2015.2471176","relation":{},"ISSN":["1939-1404","2151-1535"],"issn-type":[{"value":"1939-1404","type":"print"},{"value":"2151-1535","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,2]]}}}