{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T18:53:42Z","timestamp":1780512822668,"version":"3.54.1"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"Ministry of National Development Research Fund"},{"DOI":"10.13039\/501100001466","name":"National Parks Board - Singapore","doi-asserted-by":"publisher","award":["COT-V4-2020-6"],"award-info":[{"award-number":["COT-V4-2020-6"]}],"id":[{"id":"10.13039\/501100001466","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Sel. Top. Appl. Earth Observations Remote Sensing"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/jstars.2024.3486535","type":"journal-article","created":{"date-parts":[[2024,10,25]],"date-time":"2024-10-25T17:25:22Z","timestamp":1729877122000},"page":"19668-19681","source":"Crossref","is-referenced-by-count":5,"title":["Learning From Clutter: An Unsupervised Learning-Based Clutter Removal Scheme for GPR B-Scans"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1579-6390","authenticated-orcid":false,"given":"Qiqi","family":"Dai","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6452-9606","authenticated-orcid":false,"given":"Yee Hui","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2749-9916","authenticated-orcid":false,"given":"Hai-Han","family":"Sun","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3509-0045","authenticated-orcid":false,"given":"Jiwei","family":"Qian","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2771-4877","authenticated-orcid":false,"given":"Mohamed Lokman Mohd","family":"Yusof","sequence":"additional","affiliation":[{"name":"National Parks Board, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5431-940X","authenticated-orcid":false,"given":"Daryl","family":"Lee","sequence":"additional","affiliation":[{"name":"National Parks Board, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9920-4043","authenticated-orcid":false,"given":"Abdulkadir C.","family":"Yucel","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SSP.2001.955246"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2013.2287016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/36.752207"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/7361.987060"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2016.05.016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/AGPR.2005.1487840"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jappgeo.2017.07.007"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1117\/12.479110"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2529\/PIERS041210091503"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SSP.2001.955243"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2882912"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/12.2177944"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2017.2711251"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/09205071.2018.1489740"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2019.2937749"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2020.3026007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2016.2612582"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2931134"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2021.3089246"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2020.120371"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.aci.2018.10.001"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.23919\/USNC\/URSI49741.2020.9321692"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3138974"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2023.3275306"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2021.3098122"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/rs13091761"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10111269"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2022.3176386"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3088630"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3176029"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2022.3159788"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/USNC-URSI52151.2023.10237546"},{"key":"ref33","first-page":"8780","article-title":"Diffusion models beat GANs on image synthesis","volume":"34","author":"Dhariwal","year":"2021","journal-title":"Adv. Neural Inf. Process. Syst."},{"key":"ref34","first-page":"6840","article-title":"Denoising diffusion probabilistic models","volume":"33","author":"Ho","year":"2020","journal-title":"Adv. Neural Inf. Process. Syst."},{"key":"ref35","first-page":"2256","article-title":"Deep unsupervised learning using non-equilibrium thermodynamics","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Sohl-Dickstein"},{"key":"ref36","first-page":"IV317","article-title":"Kullback Leibler divergence between Gaussian","volume-title":"Proc. Int. Conf. Acoust., Speech Signal Process.","author":"Hershey"},{"key":"ref37","article-title":"Understanding diffusion models: A unified perspective","author":"Luo","year":"2022"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.5244\/C.30.87"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01261-8_1"},{"key":"ref41","first-page":"864","article-title":"PixelSNAIL: An improved autoregressive generative model","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Chen"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58545-7_19"},{"key":"ref43","article-title":"Instance normalization: The missing ingredient for fast stylization","author":"Ulyanov","year":"2017"},{"key":"ref44","article-title":"Deep learning using rectified linear units (ReLU)","author":"Agarap","year":"2019"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.632"},{"key":"ref46","article-title":"Representation learning with contrastive predictive coding","author":"Oord","year":"2018"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.3997\/2214-4609.202152258"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/36.387598"},{"key":"ref49","first-page":"8026","article-title":"PyTorch: An imperative style, high performance deep learning library","volume":"32","author":"Paszke","year":"2019","journal-title":"Adv. Neural Inf. Process. Syst."},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2869027"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2013.359"},{"key":"ref52","first-page":"416","article-title":"No-reference image denoising quality assessment","volume-title":"Advances in Computer Vision","volume":"943","author":"Si","year":"2019"}],"container-title":["IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4609443\/10330207\/10735359.pdf?arnumber=10735359","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T02:45:31Z","timestamp":1732675531000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10735359\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/jstars.2024.3486535","relation":{},"ISSN":["1939-1404","2151-1535"],"issn-type":[{"value":"1939-1404","type":"print"},{"value":"2151-1535","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}