{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T19:49:34Z","timestamp":1694634574265},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2008,12,1]],"date-time":"2008-12-01T00:00:00Z","timestamp":1228089600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Sel. Top. Signal Process."],"published-print":{"date-parts":[[2008,12]]},"DOI":"10.1109\/jstsp.2008.2006719","type":"journal-article","created":{"date-parts":[[2009,1,28]],"date-time":"2009-01-28T16:19:44Z","timestamp":1233159584000},"page":"817-827","source":"Crossref","is-referenced-by-count":1,"title":["An Approach of Deriving Relative Sensitivity Profiles for Image Reconstruction in MRI"],"prefix":"10.1109","volume":"2","author":[{"given":"Quang M.","family":"Tieng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter","family":"Ullmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Graham J.","family":"Galloway","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J\u00dcrgen","family":"Hennig","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gary J.","family":"Cowin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Viktor","family":"Vegh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/cmr.a.20041"},{"key":"ref11","first-page":"1610","article-title":"Relative SENSE (rSENSE) and sensitivity map calculation from k-space reconstruction coefficients (SMACKER)","author":"ullmann","year":"2004","journal-title":"Proc ISMRM"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/1522-2594(200006)43:6<779::AID-MRM1>3.0.CO;2-4"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/jmri.20115"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.2006.259697"},{"key":"ref15","article-title":"SENSE: Sensitivity encoding for fast MRI","author":"pruessmann","year":"1998","journal-title":"Proc 6th ISMRM"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1522-2594(200005)43:5<682::AID-MRM10>3.0.CO;2-G"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/jmri.1190"},{"key":"ref18","article-title":"A SMASH\/SENSE related method using ratios of array coil profiles","author":"wang","year":"1999","journal-title":"Proc 7th ISMRM"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.10087"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/1522-2594(200008)44:2<243::AID-MRM11>3.0.CO;2-L"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1522-2594(199911)42:5<952::AID-MRM16>3.0.CO;2-S"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.10171"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.1910380414"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S1352-8661(98)00015-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.1141"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1522-2594(200005)43:5<716::AID-MRM14>3.0.CO;2-K"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/1522-2594(200008)44:2<301::AID-MRM18>3.0.CO;2-D"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1118\/1.1386778"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISBI.2008.4541058"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.20492"}],"container-title":["IEEE Journal of Selected Topics in Signal Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4200690\/4740305\/04740321.pdf?arnumber=4740321","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:27:56Z","timestamp":1638217676000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4740321\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,12]]},"references-count":21,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/jstsp.2008.2006719","relation":{},"ISSN":["1932-4553"],"issn-type":[{"value":"1932-4553","type":"print"}],"subject":[],"published":{"date-parts":[[2008,12]]}}}