{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T15:41:20Z","timestamp":1777995680399,"version":"3.51.4"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Science and Technology Project of State Grid Corporation of China","award":["SGHADK00PJJS2000026"],"award-info":[{"award-number":["SGHADK00PJJS2000026"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Systems Journal"],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/jsyst.2021.3056536","type":"journal-article","created":{"date-parts":[[2021,2,23]],"date-time":"2021-02-23T20:46:51Z","timestamp":1614113211000},"page":"185-196","source":"Crossref","is-referenced-by-count":32,"title":["Fault Diagnosis of Power Systems Using Visualized Similarity Images and Improved Convolution Neural Networks"],"prefix":"10.1109","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2579-5463","authenticated-orcid":false,"given":"Ji","family":"Han","sequence":"first","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8676-3292","authenticated-orcid":false,"given":"Shihong","family":"Miao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4100-0774","authenticated-orcid":false,"given":"Yaowang","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"given":"Weichen","family":"Yang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"given":"Haoran","family":"Yin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Hubei Electric Power Security and High Efficiency Key Laboratory, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2721922"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2017.2682185"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2598881"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2018.2822549"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2016.2574875"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1142\/9789813271494_0004"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931491"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2019.2923690"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2017.2682185"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.0471"},{"issue":"34","key":"ref11","first-page":"85","article-title":"A complete analytic model for fault diagnosis of power systems","volume":"31","author":"Liu","year":"2011","journal-title":"Proc. Chin. Soc. Elect. Eng."},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.105566"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2776238"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2913006"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s12065-020-00443-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.5254"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2019.2917794"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2019.2919940"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2917367"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2754287"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/app10144965"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2988909"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.6334"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931255"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2178079"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2993808"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2015.2389824"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-019-01174-4"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106876"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2011.103"}],"container-title":["IEEE Systems Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4267003\/9741436\/09361449.pdf?arnumber=9361449","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T22:53:44Z","timestamp":1704840824000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9361449\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":30,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/jsyst.2021.3056536","relation":{},"ISSN":["1932-8184","1937-9234","2373-7816"],"issn-type":[{"value":"1932-8184","type":"print"},{"value":"1937-9234","type":"electronic"},{"value":"2373-7816","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,3]]}}}