{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T18:12:06Z","timestamp":1772302326516,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:00:00Z","timestamp":1669852800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Systems Journal"],"published-print":{"date-parts":[[2022,12]]},"DOI":"10.1109\/jsyst.2022.3172982","type":"journal-article","created":{"date-parts":[[2022,5,19]],"date-time":"2022-05-19T16:22:40Z","timestamp":1652977360000},"page":"5281-5292","source":"Crossref","is-referenced-by-count":33,"title":["A Resilient Protection Scheme for Common Shunt Fault and High Impedance Fault in Distribution Lines Using Wavelet Transform"],"prefix":"10.1109","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7385-4512","authenticated-orcid":false,"given":"Maanvi","family":"Bhatnagar","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, National Institute of Technology, Raipur, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7396-8926","authenticated-orcid":false,"given":"Anamika","family":"Yadav","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Institute of Technology, Raipur, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8270-2927","authenticated-orcid":false,"given":"Aleena","family":"Swetapadma","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, KIIT Deemed to be University, Bhubaneswar, India"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1002\/2050-7038.12164"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/S0142-0615(02)00021-2"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3022639"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2017.06.035"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2895634"},{"key":"ref13","article-title":"Modelling of high impedance faults in distribution systems and validation based on multiresolution techniques","volume":"83","author":"garcia","year":"2020","journal-title":"Comput Elect Eng"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.04.050"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/en14123623"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-019-04445-w"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2019.105931"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106846"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.106955"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksues.2019.07.001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3060800"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.0021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2021.3053769"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/2050-7038.12378"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksues.2018.12.001"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2019.2911529"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.3017698"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108366"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2035810"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2901634"},{"key":"ref1","article-title":"Impedance fault detection technology","author":"tengdin","year":"1996"},{"key":"ref20","year":"2016","journal-title":"The MathWorks"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2017.06.036"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2017.8107191"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1049\/pe:20000210","article-title":"Wavelet transforms in power systems. Part 1: General introduction to the wavelet transforms","volume":"14","author":"kim","year":"2000","journal-title":"Power Eng J"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2020.2991770"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-018-3789-2"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.08.039"}],"container-title":["IEEE Systems Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4267003\/9979155\/09778184.pdf?arnumber=9778184","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T17:37:38Z","timestamp":1760636258000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9778184\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,12]]},"references-count":31,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/jsyst.2022.3172982","relation":{},"ISSN":["1932-8184","1937-9234","2373-7816"],"issn-type":[{"value":"1932-8184","type":"print"},{"value":"1937-9234","type":"electronic"},{"value":"2373-7816","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,12]]}}}