{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T05:12:28Z","timestamp":1775711548099,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Systems Journal"],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1109\/jsyst.2023.3234655","type":"journal-article","created":{"date-parts":[[2023,1,24]],"date-time":"2023-01-24T18:44:50Z","timestamp":1674585890000},"page":"3160-3171","source":"Crossref","is-referenced-by-count":23,"title":["Using Deep Transfer Learning Technique to Protect Electrical Distribution Systems Against High-Impedance Faults"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9233-8070","authenticated-orcid":false,"given":"Amin","family":"Mohammadi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0589-9946","authenticated-orcid":false,"given":"Mohsen","family":"Jannati","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6846-4838","authenticated-orcid":false,"given":"Mohammadreza","family":"Shams","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Shahreza Campus, University of Isfahan, Isfahan, Iran"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2018.2828414"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109149"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33409-2_47"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.108042"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2222056"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2019.03.022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPES.2016.7915940"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2014.03.046"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2017.06.035"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.107041"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-07219-z"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IranianCEE.2013.6599760"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2021.107676"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksues.2018.12.001"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.10.021"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2018.05.010"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2021.3129315"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2808428"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110333"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2545923"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3075472"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108366"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2019.8929365"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.115.080602"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s40866-016-0011-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106846"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2021.107602"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.0093"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106576"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.02.012"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/tee.23126"}],"container-title":["IEEE Systems Journal"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4267003\/10146391\/10025599.pdf?arnumber=10025599","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T18:41:55Z","timestamp":1687804915000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10025599\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6]]},"references-count":31,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/jsyst.2023.3234655","relation":{},"ISSN":["1932-8184","1937-9234","2373-7816"],"issn-type":[{"value":"1932-8184","type":"print"},{"value":"1937-9234","type":"electronic"},{"value":"2373-7816","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,6]]}}}