{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T08:08:18Z","timestamp":1725610098615},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,19]]},"DOI":"10.1109\/kse56063.2022.9953777","type":"proceedings-article","created":{"date-parts":[[2022,11,21]],"date-time":"2022-11-21T16:25:53Z","timestamp":1669047953000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Detecting Coincidental Correctness and Mitigating Its Impacts on Localizing Variability Faults"],"prefix":"10.1109","author":[{"given":"Thu-Trang","family":"Nguyen","sequence":"first","affiliation":[{"name":"VNU University of Engineering and Technology,Faculty of Information Technology"}]},{"given":"Hieu Dinh","family":"Vo","sequence":"additional","affiliation":[{"name":"VNU University of Engineering and Technology,Faculty of Information Technology"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.120"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3313290"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2000791.2000795"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070507"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SATE.2016.19"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2483760.2483767"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2014.32"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.130"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1014823126938"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/366378.366379"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126621500535"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2011.25"},{"key":"ref5","article-title":"A variability fault localization approach for software product lines","author":"nguyen","year":"2021","journal-title":"IEEE Transactions on Software Engineering"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606594"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3461001.3473058"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-sen.2017.0026"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2970276.2970322"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2559932"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1984.5010248"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-020-09845-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/93548.93576"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2018.03.008"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICST46399.2020.00014"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-Companion.2019.00065"}],"event":{"name":"2022 14th International Conference on Knowledge and Systems Engineering (KSE)","start":{"date-parts":[[2022,10,19]]},"location":"Nha Trang, Vietnam","end":{"date-parts":[[2022,10,21]]}},"container-title":["2022 14th International Conference on Knowledge and Systems Engineering (KSE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9953734\/9953612\/09953777.pdf?arnumber=9953777","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T14:52:54Z","timestamp":1670856774000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9953777\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,19]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/kse56063.2022.9953777","relation":{},"subject":[],"published":{"date-parts":[[2022,10,19]]}}}