{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,8]],"date-time":"2026-02-08T01:52:40Z","timestamp":1770515560579,"version":"3.49.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,2,26]],"date-time":"2025-02-26T00:00:00Z","timestamp":1740528000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,26]],"date-time":"2025-02-26T00:00:00Z","timestamp":1740528000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004071","name":"Khon Kaen University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004071","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,2,26]]},"DOI":"10.1109\/kst65016.2025.11003343","type":"proceedings-article","created":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T17:06:30Z","timestamp":1747760790000},"page":"335-340","source":"Crossref","is-referenced-by-count":2,"title":["Llm-Based Code Comment Summarization: Efficacy Evaluation and Challenges"],"prefix":"10.1109","author":[{"given":"Peeradon","family":"Sukkasem","sequence":"first","affiliation":[{"name":"College of Computing, Khon Kaen University,Department of Computer Science,Khon Kaen,Thailand"}]},{"given":"Chitsutha","family":"Soomlek","sequence":"additional","affiliation":[{"name":"College of Computing, Khon Kaen University,Department of Computer Science,Khon Kaen,Thailand"}]},{"given":"Chanon","family":"Dechsupa","sequence":"additional","affiliation":[{"name":"College of Computing, Khon Kaen University,Department of Computer Science,Khon Kaen,Thailand"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Towards the quality factor of software maintenance process: A review","author":"Ibrahim","year":"2017","journal-title":"Journal of Telecommunication, Electronic and Computer Engineering"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCNT56998.2023.10307948"},{"issue":"3","key":"ref3","first-page":"227","article-title":"Does your code need comment?","volume":"50","author":"Huang","year":"2020","journal-title":"Software: Practice and Experience"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1109\/ICSME.2014.31","article-title":"An exploratory study on self-admitted technical debt","volume-title":"2014 IEEE International Conference on Software Maintenance and Evolution","author":"Potdar","year":"2014"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"179","DOI":"10.1109\/SANER.2016.72","article-title":"Examining the impact of self-admitted technical debt on software quality","volume-title":"2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER)","author":"Wehaibi","year":"2016"},{"key":"ref6","volume-title":"A systematic survey of text summarization: From statistical methods to large language models","author":"Zhang"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1109\/MTD.2015.7332619","article-title":"Detecting and quantifying different types of self-admitted technical debt","volume-title":"2015 IEEE 7th International Workshop on Managing Technical Debt (MTD)","author":"Maldonado","year":"2015"},{"key":"ref8","volume-title":"PRESTI: Predicting repayment effort of self-admitted technical debt using textual information","author":"Li"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"804","DOI":"10.1109\/SANER60148.2024.00087","article-title":"Selfadmitted technical debts identification: How far are we?","volume-title":"2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)","author":"Gu","year":"2024"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"100070","DOI":"10.1016\/j.nlp.2024.100070","article-title":"A survey of text summarization: Techniques, evaluation and challenges","volume":"7","author":"Supriyono","year":"2024","journal-title":"Natural Language Processing Journal"},{"key":"ref11","volume-title":"Source code summarization in the era of large language models","author":"Sun"},{"issue":"11","key":"ref12","doi-asserted-by":"crossref","first-page":"1044","DOI":"10.1109\/TSE.2017.2654244","article-title":"Using natural language processing to automatically detect self-admitted technical debt","volume":"43","author":"Maldonado","year":"2017","journal-title":"IEEE Transactions on Software Engineering"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"100662","DOI":"10.1016\/j.oor.2024.100662","article-title":"How to choose a sampling technique and determine sample size for research: A simplified guide for researchers","volume":"12","author":"Ahmed","year":"2024","journal-title":"Oral Oncology Reports"},{"key":"ref14","article-title":"BART: denoising sequence-to-sequence pre-training for natural language generation, translation, and comprehension","volume":"abs\/1910.13461","author":"Lewis","year":"2019","journal-title":"CoRR"},{"key":"ref15","volume-title":"Multi-purpose Summarizer (Fine-tuned google\/flan-t5-xl on several Summarization datasets)","author":"Clive","year":"2023"},{"issue":"140","key":"ref16","first-page":"1","article-title":"Exploring the limits of transfer learning with a unified text-to-text transformer","volume":"21","author":"Raffel","year":"2020","journal-title":"Journal of Machine Learning Research"},{"key":"ref17","first-page":"2023","article-title":"Towards a unified multidimensional evaluator for text generation","volume-title":"Proceedings of the 2022 Conference on Empirical Methods in Natural Language Processing","author":"Zhong"}],"event":{"name":"2025 17th International Conference on Knowledge and Smart Technology (KST)","location":"Bangkok, Thailand","start":{"date-parts":[[2025,2,26]]},"end":{"date-parts":[[2025,3,1]]}},"container-title":["2025 17th International Conference on Knowledge and Smart Technology (KST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11003205\/11003276\/11003343.pdf?arnumber=11003343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:09:27Z","timestamp":1747804167000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11003343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2,26]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/kst65016.2025.11003343","relation":{},"subject":[],"published":{"date-parts":[[2025,2,26]]}}}