{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T11:20:52Z","timestamp":1767093652403,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/la-cci47412.2019.9037036","type":"proceedings-article","created":{"date-parts":[[2020,3,20]],"date-time":"2020-03-20T08:23:56Z","timestamp":1584692636000},"page":"1-6","source":"Crossref","is-referenced-by-count":25,"title":["Automatic Optical Inspection for Defective PCB Detection Using Transfer Learning"],"prefix":"10.1109","author":[{"given":"Leandro H. de S.","family":"Silva","sequence":"first","affiliation":[]},{"given":"George O. de A.","family":"Azevedo","sequence":"additional","affiliation":[]},{"given":"Bruno J. T.","family":"Fernandes","sequence":"additional","affiliation":[]},{"given":"Byron L. D.","family":"Bezerra","sequence":"additional","affiliation":[]},{"given":"Estanislau B.","family":"Lima","sequence":"additional","affiliation":[]},{"given":"Sergio C.","family":"Oliveira","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASPCON.2018.8748670"},{"key":"ref11","article-title":"Online PCB defect detector on A new PCB defect dataset","volume":"abs 1902 6197","author":"tang","year":"2019","journal-title":"CoRR"},{"key":"ref12","article-title":"Towards better exploiting convolutional neural networks for remote sensing scene classification","volume":"abs 1602 1517","author":"nogueira","year":"2016","journal-title":"CoRR"},{"key":"ref13","first-page":"1","article-title":"Very Deep Convolutional Networks for Large-Scale Image Recognition","author":"simonyan","year":"2014"},{"key":"ref14","article-title":"Deep residual learning for image recognition","author":"he","year":"2015","journal-title":"CoRR"},{"key":"ref15","article-title":"How transferable are features in deep neural networks?","volume":"abs 1411 1792","author":"yosinski","year":"2014","journal-title":"CoRR"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2012.6252544"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref18","article-title":"The effectiveness of data augmentation in image classification using deep learning","volume":"abs 1712 4621","author":"perez","year":"2017","journal-title":"CoRR"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DICTA.2016.7797091"},{"key":"ref4","first-page":"1095","article-title":"Automatic optical inspection for pcb manufacturing: a survey","volume":"5","author":"mahmoud taha","year":"2014","journal-title":"International Journal of Scientific and Engineering Research"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2018.8532499"},{"key":"ref6","first-page":"523","author":"kumar","year":"2017","journal-title":"PCB Defect Classification Using Logical Combination of Segmented Copper and Non-copper Part"},{"key":"ref5","first-page":"380","article-title":"Automated pcb inspection system","volume":"6","author":"bukhari","year":"2017","journal-title":"TEM Journal"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.8279"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/WiSPNET.2017.8299858"},{"key":"ref2","article-title":"A survey: Automated visual pcb inspection algorithm","volume":"3","author":"malge","year":"2014","journal-title":"International Journal of Engineering Research & Technology"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.5772\/51699"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CCCS.2018.8586818"}],"event":{"name":"2019 IEEE Latin American Conference on Computational Intelligence (LA-CCI)","start":{"date-parts":[[2019,11,11]]},"location":"Guayaquil, Ecuador","end":{"date-parts":[[2019,11,15]]}},"container-title":["2019 IEEE Latin American Conference on Computational Intelligence (LA-CCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9028002\/9036753\/09037036.pdf?arnumber=9037036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T15:21:54Z","timestamp":1658157714000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9037036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/la-cci47412.2019.9037036","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}