{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T10:37:12Z","timestamp":1782988632655,"version":"3.54.5"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,13]]},"DOI":"10.1109\/la-cci62337.2024.10814821","type":"proceedings-article","created":{"date-parts":[[2024,12,31]],"date-time":"2024-12-31T14:24:25Z","timestamp":1735655065000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Artificial Vision System for Digital Inspection of Dimensional and Geometric Measurements in Closed-Loop Manufacturing Architecture"],"prefix":"10.1109","author":[{"given":"Brayan S.","family":"Figueroa","sequence":"first","affiliation":[{"name":"University of Brasilia,Department of Mechanical and Mechatronics Engineering,Brasilia,Brazil"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cristhian I.","family":"Ria\u00f1o","sequence":"additional","affiliation":[{"name":"University of Pamplona,Department Mechatronic Engineering,Pamplona,Colombia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cesar A","family":"Pe\u00f1a C","sequence":"additional","affiliation":[{"name":"University of Pamplona,Department Mechatronic Engineering,Pamplona,Colombia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alberto","family":"Alvares","sequence":"additional","affiliation":[{"name":"University of Brasilia,Department of Mechanical and Mechatronics Engineering,Brasilia,Brazil"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Procesos de manufactura en ingenier\u00eda industrial","author":"Erazo","year":"2008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EDPC.2015.7323210"},{"key":"ref3","article-title":"Dise\u00f1o de una m\u00e1quina herramienta de 3-ejes con tecnolog\u00eda cnc para operaciones de maquinado","author":"Mu\u00f1oz Montenegro","year":"2019"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2005.06.002"},{"key":"ref5","first-page":"40","article-title":"Procesos de manufactura con tenolog\u00eda 3d","author":"Costa","year":"2019","journal-title":"CTS Cafe"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.csi.2011.02.009"},{"key":"ref7","article-title":"Fundamentos de gd&t","year":"2022","journal-title":"KEYENCE CORPORATION"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0166-3615(99)00040-8"},{"key":"ref9","article-title":"Conceptual framework for closed-loop inspection based on the coordinate measurement technology adherent to step-nc","author":"Jaimes","year":"2021"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.6028\/jres.124.036"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/BF01179348"},{"issue":"126","key":"ref12","first-page":"145","article-title":"Taking the measure of cmms","author":"Schaffer","year":"1982","journal-title":"Am Mach"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.59540\/tech.vi01.3"},{"key":"ref14","article-title":"Caracterizaci\u00f3n de tolerancias dimensionales en ensambles mec\u00e1nicos fabricados por manufactura aditiva","author":"Parra Guzm\u00e1n","year":"2021"},{"issue":"3","key":"ref15","first-page":"5","article-title":"Implementaci\u00f3n del escaneo \u00f3ptico 3d como sistema de verificaci\u00f3n en el sena-cmm aplicado en pi\u00f1ones","volume":"1","author":"Reyes","year":"2020","journal-title":"Revista Metalnnova"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.14483\/22484728.17432"}],"event":{"name":"2024 IEEE Latin American Conference on Computational Intelligence (LA-CCI)","location":"Bogota D.C., Colombia","start":{"date-parts":[[2024,11,13]]},"end":{"date-parts":[[2024,11,15]]}},"container-title":["2024 IEEE Latin American Conference on Computational Intelligence (LA-CCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10814104\/10814729\/10814821.pdf?arnumber=10814821","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T18:34:13Z","timestamp":1764873253000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10814821\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,13]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/la-cci62337.2024.10814821","relation":{},"subject":[],"published":{"date-parts":[[2024,11,13]]}}}