{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,8]],"date-time":"2026-09-08T14:49:33Z","timestamp":1788878973982,"version":"build-2803163510"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,2]]},"DOI":"10.1109\/lascas.2015.7250421","type":"proceedings-article","created":{"date-parts":[[2015,9,11]],"date-time":"2015-09-11T00:33:59Z","timestamp":1441931639000},"page":"1-4","source":"Crossref","is-referenced-by-count":7,"title":["Nanoscale FinFET global parameter extraction for the BSIM-CMG model"],"prefix":"10.1109","author":[{"given":"Alessandra","family":"Leonhardt","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luiz Fernando","family":"Ferreira","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sergio","family":"Bampi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2010.5466821"},{"key":"ref11","article-title":"IC-CAP device modeling software – technical overview","year":"2014","journal-title":"Tech Rep"},{"key":"ref12","first-page":"4","article-title":"Dependence of FinFET RF performance on fin width","author":"lederer","year":"2006","journal-title":"Silicon Monolithic Integrated Circuits in RF Systems 2006 Digest of Papers 2006 Topical Meeting on"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2002.801263"},{"key":"ref4","article-title":"Nanoscale CMOS modeling","author":"dunga","year":"2008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2007.4339727"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-8614-3_13"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-71752-4_3"},{"key":"ref8","article-title":"Compact models for sub-22 nm MOSFETs","author":"chauhan","year":"2011","journal-title":"Proc Workshop Compact Model"},{"key":"ref7","article-title":"Phd dissertation: Compact models for future generation CMOS","author":"lu","year":"2011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2013.2260816"},{"key":"ref1","article-title":"Double-gate nanotransistors in silicon-on-insulator: simulation of sub-20 nm FinFETs","author":"ferreira","year":"2012","journal-title":"Doutorado Universidade Federal do Rio Grande do Sul Instituto de Informática Programa de Pós-Graduação em Microeletrônica"},{"key":"ref9","article-title":"BSIM-CMG 107.0.0 Multi-Gate MOSFET compact model","author":"sriramkumar","year":"2013"}],"event":{"name":"2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS 2015)","location":"Montevideo, Uruguay","start":{"date-parts":[[2015,2,24]]},"end":{"date-parts":[[2015,2,27]]}},"container-title":["2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7235122\/7250401\/07250421.pdf?arnumber=7250421","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:44:44Z","timestamp":1490384684000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7250421\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,2]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/lascas.2015.7250421","relation":{},"subject":[],"published":{"date-parts":[[2015,2]]}}}