{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:07:11Z","timestamp":1725462431100},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,2]]},"DOI":"10.1109\/lascas.2015.7250483","type":"proceedings-article","created":{"date-parts":[[2015,9,11]],"date-time":"2015-09-11T04:33:59Z","timestamp":1441946039000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Automated R<inf>DSon<\/inf> characterization for power MOSFETS"],"prefix":"10.1109","author":[{"given":"Pedro J.","family":"Escalona-Cruz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manuel A.","family":"Jimenez-Cedeno","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rogelio","family":"Palomera-Garcia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/28.952503"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TPEL.2008.2006567"},{"key":"ref10","article-title":"CoolMOS C6 Datasheet","author":"technologies","year":"2010","journal-title":"rev 2 1 2010-02-09"},{"year":"2009","author":"paul","journal-title":"Analysis and Design of Analog Integrated Circuits","key":"ref6"},{"year":"2000","author":"razavi","article-title":"Design of Analog CMOS Integrated Circuits","key":"ref5"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/CSICS.2011.6062461"},{"year":"0","author":"siliconix","journal-title":"Measuring Power MOSFET Characteristics 2010 application Note AN-957","key":"ref7"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1109\/IEDM.1979.189545","article-title":"power mosfet technology","author":"lidow","year":"1979","journal-title":"1979 International Electron Devices Meeting"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/ISIE.2006.295746"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/16.502137"}],"event":{"name":"2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS 2015)","start":{"date-parts":[[2015,2,24]]},"location":"Montevideo, Uruguay","end":{"date-parts":[[2015,2,27]]}},"container-title":["2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7235122\/7250401\/07250483.pdf?arnumber=7250483","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T19:17:53Z","timestamp":1498245473000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7250483\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,2]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/lascas.2015.7250483","relation":{},"subject":[],"published":{"date-parts":[[2015,2]]}}}