{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:31:34Z","timestamp":1730280694987,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,2]]},"DOI":"10.1109\/lascas.2019.8667562","type":"proceedings-article","created":{"date-parts":[[2019,3,18]],"date-time":"2019-03-18T21:40:27Z","timestamp":1552945227000},"page":"229-232","source":"Crossref","is-referenced-by-count":1,"title":["About Performance Faults in Microprocessor Core in-field Testing"],"prefix":"10.1109","author":[{"given":"Julio Perez","family":"Acle","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ernesto","family":"Sanchez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604075"},{"key":"ref11","first-page":"1","article-title":"FPGA-controlled PCBA power-on self-test using processor’s debug features","author":"du","year":"2016","journal-title":"2016 IEEE 19th Int Symp Des Diagnostics Electron Circuits Syst IEEE"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2356612"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2191000"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2363387"},{"journal-title":"IEEE-ISTO 5001 TM-1999 The Nexus 5001 Forum TM Standard providing the Gateway to the Embedded Systems of the Future","year":"2000","author":"o\u2019keeffe","key":"ref15"},{"key":"ref16","volume":"53","author":"stollon","year":"2013","journal-title":"On-Chip Instrumentation Design and Debug for Systems on Chip"},{"year":"0","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2456014"},{"year":"0","key":"ref19","article-title":"miniMIPS"},{"journal-title":"Cypress Tech Rep","article-title":"Cypress AN204377. FM3 and FM4 Family, IEC61508 SIL2 Self-Test Library","year":"2014","key":"ref4"},{"journal-title":"STMicroelectronics Tech Rep","article-title":"Guidelines for obtaining IEC 60335 Class B certification for any STM32 application. Application note AN3307","year":"2013","key":"ref3"},{"journal-title":"tech rep Microchip","article-title":"Microchip. 16-bit CPU Self-Test Library User ’ s Guide","year":"2012","key":"ref6"},{"year":"0","key":"ref5"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"392","DOI":"10.1016\/j.micpro.2016.09.002","article-title":"Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation","volume":"47","author":"acle","year":"2016","journal-title":"Microprocess Microsyst"},{"year":"0","key":"ref7"},{"year":"0","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437646"}],"event":{"name":"2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS)","start":{"date-parts":[[2019,2,24]]},"location":"Armenia, Colombia","end":{"date-parts":[[2019,2,27]]}},"container-title":["2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8666669\/8667535\/08667562.pdf?arnumber=8667562","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T23:14:07Z","timestamp":1657840447000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8667562\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,2]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/lascas.2019.8667562","relation":{},"subject":[],"published":{"date-parts":[[2019,2]]}}}