{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:54:38Z","timestamp":1725591278641},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,2,1]],"date-time":"2019-02-01T00:00:00Z","timestamp":1548979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,2]]},"DOI":"10.1109\/lascas.2019.8667573","type":"proceedings-article","created":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T01:40:27Z","timestamp":1552959627000},"page":"77-80","source":"Crossref","is-referenced-by-count":1,"title":["Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool"],"prefix":"10.1109","author":[{"given":"P.","family":"Bernardi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Piumatti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Sanchez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2017.8203459"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2498546"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.839486"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/92.238447"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763092"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653581"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2018.8368555"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2602971"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046234"}],"event":{"name":"2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS)","start":{"date-parts":[[2019,2,24]]},"location":"Armenia, Colombia","end":{"date-parts":[[2019,2,27]]}},"container-title":["2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8666669\/8667535\/08667573.pdf?arnumber=8667573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:14:07Z","timestamp":1657854847000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8667573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,2]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/lascas.2019.8667573","relation":{},"subject":[],"published":{"date-parts":[[2019,2]]}}}