{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:32:02Z","timestamp":1730280722470,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,2]]},"DOI":"10.1109\/lascas45839.2020.9069008","type":"proceedings-article","created":{"date-parts":[[2020,4,17]],"date-time":"2020-04-17T04:28:06Z","timestamp":1587097686000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Advancing Uncooled Infrared Imagers Using An Open-Circuit Voltage Pixel"],"prefix":"10.1109","author":[{"given":"Roman","family":"Fragasse","sequence":"first","affiliation":[]},{"given":"Ramy","family":"Tantawy","sequence":"additional","affiliation":[]},{"given":"Shane","family":"Smith","sequence":"additional","affiliation":[]},{"given":"Teressa","family":"Specht","sequence":"additional","affiliation":[]},{"given":"Zahra","family":"Taghipour","sequence":"additional","affiliation":[]},{"given":"Phillip","family":"Van Hooser","sequence":"additional","affiliation":[]},{"given":"Christopher","family":"Taylor","sequence":"additional","affiliation":[]},{"given":"Theodore J.","family":"Ronningen","sequence":"additional","affiliation":[]},{"given":"Earl","family":"Fuller","sequence":"additional","affiliation":[]},{"given":"Rudy","family":"Fink","sequence":"additional","affiliation":[]},{"given":"Sanjay","family":"Krishna","sequence":"additional","affiliation":[]},{"given":"Waleed","family":"Khalil","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1117\/3.1002766"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1117\/12.2300779"},{"year":"1999","author":"tsividis","journal-title":"Operation and Modeling of the MOS Transistor","key":"ref12"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/LED.2012.2203781"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/MIM.2011.5704805"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/JSSC.2003.811979"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1117\/1.2828640"},{"year":"2018","journal-title":"InAsSb Photovoltaic Detectors AD7682","key":"ref17"},{"year":"2008","journal-title":"Analog to digital converter","key":"ref18"},{"year":"2009","journal-title":"ADC Evaluation Module EVAL-AD76MUXCBZ","key":"ref19"},{"key":"ref4","first-page":"1030","article-title":"Rule 07","volume":"39","author":"tennant","year":"2010","journal-title":"Revisited Still a Good Heuristic Predictor of p\/n HgCdTe Photodiode Performance?\" Journal of Electronic Materials"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JSEN.2018.2878580"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1117\/12.2519211"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1007\/s11664-008-0426-3"},{"year":"1996","author":"dereniak","journal-title":"Infrared Detectors and Systems","key":"ref8"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/RAPID.2019.8864418"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/JSSC.2015.2464672"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1117\/12.160549"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1002\/9780470891179"}],"event":{"name":"2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS)","start":{"date-parts":[[2020,2,25]]},"location":"San Jose, Costa Rica","end":{"date-parts":[[2020,2,28]]}},"container-title":["2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9052588\/9068948\/09069008.pdf?arnumber=9069008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:57:08Z","timestamp":1656453428000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9069008\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,2]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/lascas45839.2020.9069008","relation":{},"subject":[],"published":{"date-parts":[[2020,2]]}}}