{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:24:36Z","timestamp":1761582276657,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,2,27]],"date-time":"2023-02-27T00:00:00Z","timestamp":1677456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,27]],"date-time":"2023-02-27T00:00:00Z","timestamp":1677456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,2,27]]},"DOI":"10.1109\/lascas56464.2023.10108221","type":"proceedings-article","created":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T18:23:41Z","timestamp":1682965421000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Overview of Cryogenic Operation in Nanoscale Technology Nodes"],"prefix":"10.1109","author":[{"given":"Noam","family":"Roknian","sequence":"first","affiliation":[{"name":"Bar-Ilan University,EnISC Labs, Faculty of Engineering,Ramat-Gan,Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yonatan","family":"Shoshan","sequence":"additional","affiliation":[{"name":"Bar-Ilan University,EnISC Labs, Faculty of Engineering,Ramat-Gan,Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Inbal","family":"Stanger","sequence":"additional","affiliation":[{"name":"Bar-Ilan University,EnISC Labs, Faculty of Engineering,Ramat-Gan,Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adam","family":"Teman","sequence":"additional","affiliation":[{"name":"Bar-Ilan University,EnISC Labs, Faculty of Engineering,Ramat-Gan,Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Edoardo","family":"Charbon","sequence":"additional","affiliation":[{"name":"AQUA, School of Engineering, Ecole Polytechnique Fédérale de Lausanne,Lausanne,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Fish","sequence":"additional","affiliation":[{"name":"Bar-Ilan University,EnISC Labs, Faculty of Engineering,Ramat-Gan,Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1088\/1361-6641\/32\/2\/023002"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/PROC.1964.3296"},{"year":"2018","author":"beckers","journal-title":"Revised theoretical limit of the subthreshold swing in field-effect transistors","key":"ref15"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/JEDS.2018.2821763"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/JEDS.2020.2989629"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TED.2018.2854701"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.cryogenics.2005.12.002"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/MWSCAS.2011.6026405"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/JEDS.2020.2976546"},{"key":"ref16","first-page":"67","article-title":"Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology","author":"chabane","year":"2021","journal-title":"ESSCIRC 2021"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TED.2021.3097971"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/ESSDERC.2017.8066592"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/ISCAS45731.2020.9180666"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1088\/1748-0221\/15\/06\/P06026"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/ISCAS48785.2022.9937556"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/JEDS.2018.2828465"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/CCE50788.2020.9299192"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/EDTM50988.2021.9420957"},{"key":"ref21","first-page":"1","article-title":"Electrical and Thermal Characterization for SOI p-type FinFET down to Sub-Kelvin Temperatures","author":"l\u00f3pez-l","year":"2020","journal-title":"2020 IEEE Latin America Electron Devices Conference (LAEDC)"},{"key":"ref8","first-page":"71","article-title":"Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing","author":"han","year":"2021","journal-title":"IEEE ESSCIRC"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/LSSC.2020.3017705"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/ESSDERC.2019.8901806"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/LED.2008.2000614"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ECTC.2017.54"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1145\/3061639.3072948"},{"key":"ref5","article-title":"CESAR: Cryogenic Electronics for Space Applications","volume":"176","author":"reveret","year":"2014","journal-title":"Journal of Low Temperature Physics"}],"event":{"name":"2023 IEEE 14th Latin America Symposium on Circuits and Systems (LASCAS)","start":{"date-parts":[[2023,2,28]]},"location":"Quito, Ecuador","end":{"date-parts":[[2023,3,3]]}},"container-title":["2023 IEEE 14th Latin America Symposium on Circuits and Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10108078\/10108098\/10108221.pdf?arnumber=10108221","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T17:39:40Z","timestamp":1684777180000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10108221\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,27]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/lascas56464.2023.10108221","relation":{},"subject":[],"published":{"date-parts":[[2023,2,27]]}}}