{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,24]],"date-time":"2025-04-24T04:06:49Z","timestamp":1745467609390,"version":"3.40.4"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T00:00:00Z","timestamp":1740441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T00:00:00Z","timestamp":1740441600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,2,25]]},"DOI":"10.1109\/lascas64004.2025.10966286","type":"proceedings-article","created":{"date-parts":[[2025,4,22]],"date-time":"2025-04-22T17:37:30Z","timestamp":1745343450000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A LUT-Based Calibration Approach of the ESP32 ADC for a Power Quality Analyzer"],"prefix":"10.1109","author":[{"given":"K\u00e9lton da Rosa","family":"Severo","sequence":"first","affiliation":[{"name":"Integrated Exploration of Energetic Resources - EIRE"}]},{"given":"Jos\u00e9 Wagner M.","family":"Kaehler","sequence":"additional","affiliation":[{"name":"Integrated Exploration of Energetic Resources - EIRE"}]},{"given":"Cr\u00edstian","family":"M\u00fcller","sequence":"additional","affiliation":[{"name":"Computer Architecture and Microelectronics Group - GAMA, Federal University of Pampa - UNIPAMPA,Alegrete, Rio Grande do Sul,Brazil"}]},{"given":"Alessandro G.","family":"Girardi","sequence":"additional","affiliation":[{"name":"Computer Architecture and Microelectronics Group - GAMA, Federal University of Pampa - UNIPAMPA,Alegrete, Rio Grande do Sul,Brazil"}]},{"given":"Natalia Braun","family":"Chagas","sequence":"additional","affiliation":[{"name":"Integrated Exploration of Energetic Resources - EIRE"}]},{"given":"Paulo C\u00e9sar C.","family":"de Aguirre","sequence":"additional","affiliation":[{"name":"Computer Architecture and Microelectronics Group - GAMA, Federal University of Pampa - UNIPAMPA,Alegrete, Rio Grande do Sul,Brazil"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"crossref","first-page":"103363","DOI":"10.1016\/j.seta.2023.103363","article-title":"Integration of smart grid with renewable energy sources: Opportunities and challenges - a comprehensive review","volume":"58","author":"Kataray","year":"2023","journal-title":"Sustainable Energy Technologies and Assessments"},{"issue":"32","key":"ref2","doi-asserted-by":"crossref","first-page":"205","DOI":"10.1146\/annurev.energy.32.080106.133554","article-title":"Renewable energy futures: Targets, scenarios, and pathways","volume":"32","author":"Martinot","year":"2007","journal-title":"Annual Review of Environment and Resources"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/SURV.2011.101911.00087"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TSG.2012.2225851"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TSG.2018.2818167"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ACCESS.2024.3391807"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/JIOT.2023.3340858"},{"key":"ref8","first-page":"261","article-title":"Characterization and performance evaluation of esp32 for real-time synchronized sensor networks","volume-title":"2024, international Conference on Industry Sciences and Computer Science Innovation","volume":"237","author":"Espinosa-Gavira"},{"year":"2021","journal-title":"ANEEL Resolu\u00e7\u00e3o Normativa","article-title":"Procedimento de distribui\u00e7\u00e3o de energia el\u00e9trica no sistema el\u00e9trico nacional (prodist): M\u00f3dulo 8-qualidade da energia el\u00e9trica","key":"ref9"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TCOMM.2011.061511.100749"},{"year":"2023","journal-title":"NBR IEC 61000-4\u201330","article-title":"Electromagnetic compatibility (emc) part 4\u201330: Testing and measurement techniques - power quality measurement methods","key":"ref11"}],"event":{"name":"2025 IEEE 16th Latin America Symposium on Circuits and Systems (LASCAS)","start":{"date-parts":[[2025,2,25]]},"location":"Bento Gon\u00e7alves, Brazil","end":{"date-parts":[[2025,2,28]]}},"container-title":["2025 IEEE 16th Latin America Symposium on Circuits and Systems (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10966227\/10966228\/10966286.pdf?arnumber=10966286","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T05:20:44Z","timestamp":1745385644000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10966286\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2,25]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/lascas64004.2025.10966286","relation":{},"subject":[],"published":{"date-parts":[[2025,2,25]]}}}