{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T09:19:28Z","timestamp":1775035168796,"version":"3.50.1"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T00:00:00Z","timestamp":1771891200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T00:00:00Z","timestamp":1771891200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,2,24]]},"DOI":"10.1109\/lascas67804.2026.11457152","type":"proceedings-article","created":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T19:50:57Z","timestamp":1774986657000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["RF Design-Oriented ACM Model Generation Using Parametric Test and Machine Learning Regression in 28nm FD-SOI CMOS Technology"],"prefix":"10.1109","author":[{"given":"C. A.","family":"Dobrin","sequence":"first","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"D. G. Alves","family":"Neto","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,F-38000"}]},{"given":"D.","family":"Gaidioz","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"P.","family":"Cathelin","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"S.","family":"Bourdel","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,F-38000"}]},{"given":"M. J.","family":"Barragan","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA,Grenoble,France,F-38000"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2020.2991412"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tmtt.2023.3322750"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/NewCAS58973.2024.10666369"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/prime66228.2025.11203325"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.720397"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/BF01239381"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/iscas58744.2024.10558500"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/access.2024.3474424"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3198644"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/access.2024.3417316"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/icecs202256217.2022.9970862"}],"event":{"name":"2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS)","location":"Arequipa, Peru","start":{"date-parts":[[2026,2,24]]},"end":{"date-parts":[[2026,2,27]]}},"container-title":["2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11457069\/11457071\/11457152.pdf?arnumber=11457152","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T06:21:21Z","timestamp":1775024481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11457152\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2,24]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/lascas67804.2026.11457152","relation":{},"subject":[],"published":{"date-parts":[[2026,2,24]]}}}