{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:30:40Z","timestamp":1730280640049,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/lats49555.2020.9093671","type":"proceedings-article","created":{"date-parts":[[2020,5,14]],"date-time":"2020-05-14T23:44:03Z","timestamp":1589499843000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Parametric faults detection and concealment on imager with FPGA implementation"],"prefix":"10.1109","author":[{"given":"Ghislain Takam","family":"Tchendjou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emmanuel","family":"Simeu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/AO.47.006904"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2009.5395817"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2017.12.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCE.2008.4559487"},{"key":"ref11","first-page":"8","article-title":"Zynq-7000 epp sets stage for new era of innovations","volume":"75","author":"santarini","year":"2011","journal-title":"Xcell Journal"},{"key":"ref5","first-page":"312","article-title":"A circuit for the correction of pixel defects in image sensors","author":"meynants","year":"1998","journal-title":"Proc 1998 Eur Solid-State Circuits Conf ESSCIRC 98"},{"key":"ref12","article-title":"Accelerating opencv applications with zynq-7000 all programmable soc using vivado hls video libraries","author":"neuendorffer","year":"2013","journal-title":"Xilinx Inc"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DICTA.2011.34"},{"journal-title":"Dead Pixel Real-time Detection Method for Image","year":"2009","author":"chan","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758638"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474149"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2008.930649"}],"event":{"name":"2020 IEEE Latin American Test Symposium (LATS)","start":{"date-parts":[[2020,3,30]]},"location":"Maceio, Brazil","end":{"date-parts":[[2020,4,2]]}},"container-title":["2020 IEEE Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9088113\/9093665\/09093671.pdf?arnumber=9093671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:51:49Z","timestamp":1656438709000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9093671\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/lats49555.2020.9093671","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}