{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,7]],"date-time":"2025-04-07T18:08:10Z","timestamp":1744049290596,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/lats49555.2020.9093684","type":"proceedings-article","created":{"date-parts":[[2020,5,14]],"date-time":"2020-05-14T23:44:03Z","timestamp":1589499843000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Soft Error Reliability of SRAM cells during the three operation states"],"prefix":"10.1109","author":[{"given":"Cleiton M.","family":"Marques","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristina","family":"Meinhardt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paulo F.","family":"Butzen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2916191"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-8363-1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2017.10.002"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2429589"},{"journal-title":"ASU Predictive Technology Model","year":"0","key":"ref14"},{"journal-title":"NGSPICE Simulator Website [Online]","year":"0","key":"ref15"},{"key":"ref16","first-page":"1","article-title":"Estimation of Static Noise Margin by Butterfly Method Using Curve-Fitting Technique","volume":"13","author":"rajput","year":"2018","journal-title":"Journal of Active and Passive Electronic Devices"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2009.5994579"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2009.5090294"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.09.002"},{"journal-title":"Robust SRAM Designs and Analysis","year":"2012","author":"singh","key":"ref3"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"1642","DOI":"10.1109\/TNS.2015.2450997","article-title":"Study of neutron soft error rate (SER) sensitivity: investigation of upset mechanisms by comparative simulation of finfet and planar mosfet SRAMs","volume":"62","author":"jinhyun","year":"2015","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"2300","DOI":"10.1016\/j.microrel.2014.07.109","article-title":"Comparative soft error evaluation of layout cells in FinFET technology","volume":"54","author":"laurent","year":"2014","journal-title":"Microelectronics Reliability"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173251"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.504.0433"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5993828"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855790"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2018.8368578"}],"event":{"name":"2020 IEEE Latin American Test Symposium (LATS)","start":{"date-parts":[[2020,3,30]]},"location":"Maceio, Brazil","end":{"date-parts":[[2020,4,2]]}},"container-title":["2020 IEEE Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9088113\/9093665\/09093684.pdf?arnumber=9093684","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:51:49Z","timestamp":1656438709000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9093684\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/lats49555.2020.9093684","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}