{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:42:18Z","timestamp":1725586938318},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/lats49555.2020.9093687","type":"proceedings-article","created":{"date-parts":[[2020,5,14]],"date-time":"2020-05-14T23:44:03Z","timestamp":1589499843000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A Test Architecture and VIE to Characterize Dielectric Absorption in Small Capacitors"],"prefix":"10.1109","author":[{"given":"Carlos","family":"Bernal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manuel","family":"Jimenez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chris","family":"Aquino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raul","family":"Cedres","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.481317"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/32\/14\/201"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/MEASUREMENT.2017.7983536"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DIAGNOSTIKA.2018.8526035"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2015.7102499"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2004339"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2006.1692643"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2291951"}],"event":{"name":"2020 IEEE Latin American Test Symposium (LATS)","start":{"date-parts":[[2020,3,30]]},"location":"Maceio, Brazil","end":{"date-parts":[[2020,4,2]]}},"container-title":["2020 IEEE Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9088113\/9093665\/09093687.pdf?arnumber=9093687","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:51:49Z","timestamp":1656438709000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9093687\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/lats49555.2020.9093687","relation":{},"subject":[],"published":{"date-parts":[[2020,3]]}}}