{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T12:33:46Z","timestamp":1725798826566},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,27]],"date-time":"2021-10-27T00:00:00Z","timestamp":1635292800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,27]],"date-time":"2021-10-27T00:00:00Z","timestamp":1635292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,27]],"date-time":"2021-10-27T00:00:00Z","timestamp":1635292800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,27]]},"DOI":"10.1109\/lats53581.2021.9651760","type":"proceedings-article","created":{"date-parts":[[2021,12,30]],"date-time":"2021-12-30T00:52:03Z","timestamp":1640825523000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Comparing different solutions for testing resistive defects in low-power SRAMs"],"prefix":"10.1109","author":[{"given":"N.","family":"Mirabella","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Grosso","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Franchino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Rinaudo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Deretzis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"La Magna","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13 um and 90nm Technologies","author":"dilillo","year":"0","journal-title":"IEEE Design Automation Conference"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1998","author":"van de goor","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.37"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347645"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-1169-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011170"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2003.1231664"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090873"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.244016"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.4236\/cs.2017.82003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS50862.2020.9095717"},{"key":"ref6","article-title":"Impact of Resistive-Bridging Defects in SRAM Core-Cell","author":"alves fonseca","year":"0","journal-title":"IEEE International Symposium on Electronic Design Test & Applications"},{"journal-title":"Advanced test Methods for SRAMs - Effective Solutions for Dynamic fault Detection in Nanoscaled Technologies","year":"2010","author":"bosio","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569373"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.75"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114100"},{"journal-title":"International technology roadmap of semiconductors","year":"2015","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569373"}],"event":{"name":"2021 IEEE 22nd Latin American Test Symposium (LATS)","start":{"date-parts":[[2021,10,27]]},"location":"Punta del Este, Uruguay","end":{"date-parts":[[2021,10,29]]}},"container-title":["2021 IEEE 22nd Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9651729\/9651735\/09651760.pdf?arnumber=9651760","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T17:00:02Z","timestamp":1652202002000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9651760\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,27]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/lats53581.2021.9651760","relation":{},"subject":[],"published":{"date-parts":[[2021,10,27]]}}}