{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:42:06Z","timestamp":1764175326304,"version":"3.37.3"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T00:00:00Z","timestamp":1662336000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T00:00:00Z","timestamp":1662336000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002347","name":"Federal Ministry of Education and Research","doi-asserted-by":"publisher","award":["16ES1134,16ES1133K"],"award-info":[{"award-number":["16ES1134,16ES1133K"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,5]]},"DOI":"10.1109\/lats57337.2022.9936991","type":"proceedings-article","created":{"date-parts":[[2022,11,14]],"date-time":"2022-11-14T21:59:39Z","timestamp":1668463179000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs"],"prefix":"10.1109","author":[{"given":"T. S.","family":"Copetti","sequence":"first","affiliation":[{"name":"RWTH Aachen University,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Nilovic","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Fieback","sequence":"additional","affiliation":[{"name":"Delft University of Technology,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Gemmeke","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"Delft University of Technology,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L. M.","family":"Bolzani Poehls","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"issue":"8","key":"ref1","first-page":"114","article-title":"Cramming more components onto integrated circuits","volume-title":"Electronics","volume":"38","author":"Moore","year":"1965"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927083"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190812"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176603"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624895"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05968-8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2253329"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC53125.2021.9606993"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.3018502"},{"volume-title":"Jart vcm v1b","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/test.2018.8624819"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.219"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2253329"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465401"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICED.2008.4786640"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2100270"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2011.5985934"},{"key":"ref24","first-page":"150","article-title":"Effectiveness of a hardware-based approach to detect resistive-open defects in sram cells under process variations","volume-title":"Microelectronics Reliability","volume":"67","author":"Gomez","year":"2016"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2010.5784646"},{"issue":"8","key":"ref26","first-page":"3318","article-title":"Endurance Statistical Behavior of Resistive Memories Based on Experimental and Theoretical Investigation","volume-title":"IEEE Trans. Electron Devices","volume":"66","author":"Robayo","year":"2019"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/LATS53581.2021.9651789"}],"event":{"name":"2022 IEEE 23rd Latin American Test Symposium (LATS)","start":{"date-parts":[[2022,9,5]]},"location":"Montevideo, Uruguay","end":{"date-parts":[[2022,9,8]]}},"container-title":["2022 IEEE 23rd Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9936897\/9936898\/09936991.pdf?arnumber=9936991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T04:31:46Z","timestamp":1725251506000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9936991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,5]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/lats57337.2022.9936991","relation":{},"subject":[],"published":{"date-parts":[[2022,9,5]]}}}