{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:28:13Z","timestamp":1744954093064,"version":"3.28.0"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3,21]]},"DOI":"10.1109\/lats58125.2023.10154491","type":"proceedings-article","created":{"date-parts":[[2023,6,24]],"date-time":"2023-06-24T00:24:05Z","timestamp":1687566245000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning"],"prefix":"10.1109","author":[{"given":"Esther","family":"Goudet","sequence":"first","affiliation":[{"name":"Institut Polytechnique de Paris,LTCI, Télécom Paris,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luis Pe\u00f1a","family":"Trevi\u00f1o","sequence":"additional","affiliation":[{"name":"Institut Polytechnique de Paris,LTCI, Télécom Paris,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lirida","family":"Naviner","sequence":"additional","affiliation":[{"name":"Institut Polytechnique de Paris,LTCI, Télécom Paris,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Marc","family":"Daveau","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Roche","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","start":{"date-parts":[[2023,3,21]]},"location":"Veracruz, Mexico","end":{"date-parts":[[2023,3,24]]}},"container-title":["2023 IEEE 24th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10154476\/10154477\/10154491.pdf?arnumber=10154491","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:38:07Z","timestamp":1729705087000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154491\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,21]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/lats58125.2023.10154491","relation":{},"subject":[],"published":{"date-parts":[[2023,3,21]]}}}